S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 66

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

STANDARD CELL S1K50000 SERIES
DESIGN GUIDE
<Example of APF format>
*
EXAMPLE
$RATE 200000
$STROBE
$RESOLUTIO N 0.001ns
$NODE
TSTEN
INP0
INP1
INP2
IN
BID1
OUT1
OUT2
OUT3
OUT4
$ENDNODE
$PATTERN
#
#
#
#
#
#
#
#
#
Note: A period (.) denotes a 1 or 0.
$ENDPATTERN
#
# EOF
0
1
2
3
4
5
6
7
8
of Test Pattern forAC & DC Test
I
I
I
I
I
BU 0
0
0
0
0
185000
0
0
0
0
0
0000.XXXXX
1000.LLLLX
1000.LLLLX
1001.LLLHX
1000.LLLLX
1101.0HZHX
1101.1HZHX
1000.LLLLX
1010.HHHHX
TIIIIBOOOO
SNNNNIUUUU
TPPP DTTTT
E012 11234
N
IIIIIBOOOO
Figure 4-2 Example of a Test Pattern Created for a Test Option
U
; Pull-up/down off
; AC path output (high), other outputs (low)
; AC path output (low), other outputs (low)
; AC path output (low), other outputs (low)
; Off state, normal output (high) (input low)
; Off state, normal output (high) (input high)
; Output (low)
; Output (high)
EPSON
Chapter 4: Circuit Design Taking Testability into Account
(High) (Input low)
Measures the dedicated AC path
As above
Measures the output characteristics
Measures the off-state leakage curren
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