S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 81

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

Chapter 6: Creating Test Patterns
6.3.5 Strobe
6.4 Precautions Regarding DC Test
76
The strobe-related limitations are as follows:
(a) Only one type of strobe can be defined in each test pattern.
(b) The minimum value of a strobe must be such that, under all conditions, the strobe remains
(c) Make sure the maximum value of a strobe is smaller than (test rate – 15 ns).
(d) Set a strobe in increments of 1 ns.
Not only are test patterns used for function tests, they also are used for DC tests in which the
output voltage is measured. In the creation of a test pattern, make sure the DC test specified
below can be performed.
A DC test is performed in order to verify the DC parameters of an LSI. Therefore, the
measured pins cannot change state in a measurement event following strobe input.
The following are the items of DC parameters to be measured:
(a) Output-characteristic test (V
(b) Quiescent-current test (I
active for 30 ns or more after all output signals have had their state changed by an applied
input signal.
Measure the current drive capability of an output buffer. After setting the measured pins to
the intended output level, measure the value of a voltage drop that occurs when a current
load stipulated in the specification is applied.
In order for an output-characteristic test to be performed, the test pattern must have all
states in which the measured pins can operate. In addition, said states cannot change in a
measurement event, even when the test rate is extended to infinity.
“Quiescent current” refers to a leakage current that flows in the LSI in which inputs are in a
steady state. Because the amount of this current is generally very small, measurements
must be made under conditions in which no currents other than the leakage current are
flowing. To this end, all of the conditions specified below must be met. In addition, events
in which the quiescent current can be measured must be set at two or more locations.
DDS
)
OH
, V
OL
)
EPSON
STANDARD CELL S1K50000 SERIES
DESIGN GUIDE