S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 80

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

6.3 Limitations on Test Patterns
6.3.1 Test Rate and the Number of Events
6.3.2 Input Delay
6.3.3 Pulse Width
6.3.4 Input-Waveform Format
STANDARD CELL S1K50000 SERIES
DESIGN GUIDE
A test pattern set for the actual operating frequency is used for simulation during timing
design. Because this test pattern is also used for product inspection at shipment, it must be
suited for the limitations on LSI testers. Observe the limitations described below in the
creation of a test pattern.
The test rate must be 100 ns or more, in increments of 1 ns (recommended rate: 200 ns). It
must also be defined in conformity with the limitations described in Section 6.3.5, “Strobe.”
Furthermore, LSI testers are subject to limitations on the number of events, which must also
be satisfied.
(a) Range of input delay
(b) Phase difference in input delay
(c) Types of input delays
The pulse width of an RZ waveform must be 15 ns or more.
The input waveform can take on the value 0, 1, P, or N. P and N represent pulse inputs in the
RZ waveform. In addition, P and N can only take on a combination of values, such as (0, P) or
(1, N), and no other combinations for the same pin in one test pattern.
For bidirectional pins, an RZ waveform can only be entered in cases in which the output state
is nonexistent. These pins are handled in the same way as for input pins.
Number of events per test pattern
Number of test patterns
Total number of events in test patterns
0 ns
Define the input delay within the above range in increments of 1 ns. For the limitations on
strobe points, see Section 6.3.5, “Strobe.”
3 ns or more
Within eight types in one test pattern. A 0-ns delay is treated as one type. A delay value in
an RZ waveform and the same delay value in an NRZ waveform are treated as different
types. A delay value and the same delay value within an RZ waveform or NRZ waveform
are treated as the same type.
input-delay value < strobe point
EPSON
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:
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Up to 256K
Up to 30
Up to 1M
Chapter 6: Creating Test Patterns
75