ST7FOXK1T6 STMicroelectronics, ST7FOXK1T6 Datasheet - Page 203

• Manufacturer Part Number: ST7FOXK1T6
• Description: IC MCU 8BIT 1V FLASH MEM 32LQFP
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST7FOXK1T6

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: I²C
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 24
• Program Memory Size: 4KB (4K x 8)
• Program Memory Type: FLASH
• Ram Size: 384 x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 10x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 32-LQFP
• Processor Series: ST7FOXx
• Core: ST7
• Data Bus Width: 8 bit
• Data Ram Size: 384 B
• Interface Type: I2C
• Maximum Clock Frequency: 8 MHz
• Number Of Programmable I/os: 24
• Number Of Timers: 4
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Development Tools By Supplier: ST7FLITE-SK/RAIS, STX-RLINK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 1 Channel
• For Use With: 497-5049 - KIT STARTER RAISONANCE ST7FLITE
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: 497-6336

ST7FOXF1, ST7FOXK1, ST7FOXK2
12.8.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: Human Body model and Machine model. This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Table 85.
1. Data based on characterization results, not tested in production.
Static latch-up (LU)
Two complementary static tests are required on six parts to assess the latch-up
performance.
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
Table 86.
V
V
Symbol
Symbol
ESD(HBM)
ESD(CDM)
LU
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin.
ESD absolute maximum ratings
Electrical sensitivities
Electrostatic discharge voltage (Charge Device
Electrostatic discharge voltage (Human Body
Static latch-up class
Parameter
Ratings
model)
model)
Conditions
T
A
= +85 °C
Conditions
T
T
A
A
=+25 °C
=+25 °C
Electrical characteristics
Maximum
value
4000
500
(1)
Class
A
203/226
Unit
V