MPC555LFMZP40 Freescale Semiconductor, MPC555LFMZP40 Datasheet - Page 761

IC MCU 32BIT 40MHZ 272-BGA

MPC555LFMZP40

Manufacturer Part Number
MPC555LFMZP40
Description
IC MCU 32BIT 40MHZ 272-BGA
Manufacturer
Freescale Semiconductor
Series
MPC5xxr
Datasheets

Specifications of MPC555LFMZP40

Core Processor
PowerPC
Core Size
32-Bit
Speed
40MHz
Connectivity
CAN, EBI/EMI, SCI, SPI, UART/USART
Peripherals
POR, PWM, WDT
Number Of I /o
101
Program Memory Size
448KB (448K x 8)
Program Memory Type
FLASH
Ram Size
26K x 8
Voltage - Supply (vcc/vdd)
2.5 V ~ 2.7 V
Data Converters
A/D 32x10b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
272-PBGA
Controller Family/series
POWER 5xx
Ram Memory Size
26KB
Cpu Speed
63MIPS
Embedded Interface Type
QSPI, SCI, TouCAN
Operating Temperature Range
-40°C To +125°C
No. Of Pins
272
Rohs Compliant
No
Processor Series
MPC5xx
Core
PowerPC
Data Bus Width
32 bit
Data Ram Size
26 KB
Interface Type
CAN, QSPI, SCI
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
101
Operating Supply Voltage
3.3 V to 5 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Development Tools By Supplier
MPC555CMEE
Minimum Operating Temperature
- 85 C
On-chip Adc
10 bit, 32 Channel
Cpu Family
MPC55xx
Device Core
PowerPC
Device Core Size
32b
Frequency (max)
40MHz
Total Internal Ram Size
32KB
# I/os (max)
101
Operating Supply Voltage (typ)
5V
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
272
Package Type
BGA
For Use With
MPC555CMEE - KIT EVAL FOR MPC555
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No

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22.8 Non-IEEE 1149.1-1990 Operation
22.9 Boundary Scan Register
MPC555
USER’S MANUAL
In non-IEEE 1149.1-1990 operation, the IEEE 1149.1-1990 test logic must be kept
transparent to the system logic by forcing and holding the TAP controller into the test-
logic-reset controller state. There are two methods of forcing and holding the control-
ler to this state. The first is to assert the TRST signal, forcing the TAP into the test-
logic-reset controller state. The second is to provide at least five TCK pulses with
TMS held high.
The best approach is to connect a pull down resistor to TRST, or to connect it to
PORESET with a resistor. If bounday scan is required, the JTAG controller should
drive TRST to the negated state (“1” value) following PORESET.
The MPC555 / MPC556 scan chain implementation has a 346-bit boundary scan reg-
ister. This register contains bits for all device signal and clock pins and associated con-
trol signals. The XTAL, EXTAL and XFC pins are associated with analog signals and
are not included in the boundary scan register.
An IEEE-1149.1 compliant boundary scan register has been included on the MPC555
/ MPC556. This 346-bit boundary scan register can be connected between TDI and
TDO when EXTEST or SAMPLE/PRELOAD instructions are selected. This register is
used for capturing signal pin data on the input pins, forcing fixed values on the output
signal pins, and selecting the direction and drive characteristics (a logic value or high
impedance) of the bidirectional and three-state signal pins.
ure 22-8
2. The TCK input is not blocked in low-power stop mode. To consume minimal
3. The TMS, TDI and TRST pins include on-chip pullup resistors. In low-power
/
MPC556
power, the TCK input should be externally connected to VDD or ground, al-
though TCK pin is internally connected to ground.
stop mode, these three pins should remain either unconnected or connected to
VDD to achieve minimal power consumption.
depict the various cell types.
For proper reset of the scan chain test logic, the best approach is to
assert TRST at power on reset (PORESET).
Freescale Semiconductor, Inc.
IEEE 1149.1-COMPLIANT INTERFACE (JTAG)
For More Information On This Product,
Go to: www.freescale.com
Rev. 15 October 2000
NOTE
Figure 22-5
through
MOTOROLA
Fig-
22-7

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