DEMO9S08LC60 Freescale Semiconductor, DEMO9S08LC60 Datasheet - Page 348

BOARD DEMO FOR 9S08LC60

DEMO9S08LC60

Manufacturer Part Number
DEMO9S08LC60
Description
BOARD DEMO FOR 9S08LC60
Manufacturer
Freescale Semiconductor
Type
MCUr
Datasheets

Specifications of DEMO9S08LC60

Contents
Evaluation Board
Processor To Be Evaluated
MC9S08LC60
Interface Type
RS-232, USB
Silicon Manufacturer
Freescale
Core Architecture
HCS08
Core Sub-architecture
HCS08
Silicon Core Number
MC9S08
Silicon Family Name
S08LC
Rohs Compliant
Yes
For Use With/related Products
MC9S08LC60
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Appendix A Electrical Characteristics
A.12 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.12.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in all four package orientations
(North, South, East and West). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the Radiated RF Emissions test report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
348
NOTES:
1. This data based on qualification test results. Not tested in production.
2. The reported emission level is the value of the maximum emission, rounded up to the next whole dB, from
among the mesured orienations in each frequency range.
3. IEC levels are as specified in IEC 61967-1 and IEC 61967-2.
4. SAE levels are as specified in SAE J1752/1 and SAE J1752/3.
Package
80 LQFP
Radiated Emissions
Voltage
Supply
[V]
3.3
Table 17-7. Radiated RF Emissions Characteristics
Ambient
MC9S08LC60 Series Data Sheet: Technical Data, Rev. 4
Temp.
[
o
25
C]
External crystal,
Frequency
Oscillator
Source &
Internal
16 MHz
System Bus
Frequency
20 MHz
8 MHz
Test Frequency
500 - 1000 MHz
500 - 1000 MHz
0.150 - 50 MHz
0.150 - 50 MHz
150 - 500 MHz
150 - 500 MHz
50 - 150 MHz
50 - 150 MHz
SAE Level
SAE Level
IEC Level
IEC Level
Range
1
3
3
4
4
Freescale Semiconductor
Emissions
[Typical]
Level
15
10
17
12
-3
-3
3
3
L
2
L
2
2
dBuV
dBuV
Unit
-
-
-
-

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