SAM9XE512 Atmel Corporation, SAM9XE512 Datasheet - Page 65

• Manufacturer Part Number: SAM9XE512
• Manufacturer: Atmel Corporation

Specifications of SAM9XE512

• Flash (kbytes): 512 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 180 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 2
• Uart: 6
• Ssc: 1
• Ethernet: 1
• Sd / Emmc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: Yes
• Adc Channels: 4
• Adc Resolution (bits): 10
• Adc Speed (ksps): 312
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.65 to 1.95
• Fpu: No
• Mpu / Mmu: No / Yes
• Timers: 6
• Output Compare Channels: 6
• Input Capture Channels: 6
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12.5
12.6
12.6.1
12.6.2
12.6.3
6254C–ATARM–22-Jan-10
JTAG Port Pins
Functional Description
Test Pin
Embedded In-circuit Emulator
Debug Unit
TMS, TDI and TCK are Schmitt trigger inputs and have no pull-up resistors.
TDO and RTCK are outputs, driven at up to VDDIOP0, and have no pull-up resistors.
The JTAGSEL pin is used to select the JTAG boundary scan when asserted at a high level (tied
to VDDBU). It integrates a permanent pull-down resistor of about 15 kΩ to GNDBU, so that it can
be left unconnected for normal operations.
All the JTAG signals are supplied with VDDIOP0.
One dedicated pin, TST, is used to define the device operating mode. The user must make sure
that this pin is tied at low level to ensure normal operating conditions. Other values associated
with this pin are reserved for manufacturing test.
The ARM9EJ-S Embedded In-Circuit Emulator-RT is supported via the ICE/JTAG port. It is con-
nected to a host computer via an ICE interface. Debug support is implemented using an
ARM9EJ-S core embedded within the ARM926EJ-S. The internal state of the ARM926EJ-S is
examined through an ICE/JTAG port which allows instructions to be serially inserted into the
pipeline of the core without using the external data bus. Therefore, when in debug state, a store-
multiple (STM) can be inserted into the instruction pipeline. This exports the contents of the
ARM9EJ-S registers. This data can be serially shifted out without affecting the rest of the
system.
There are two scan chains inside the ARM9EJ-S processor which support testing, debugging,
and programming of the Embedded ICE-RT. The scan chains are controlled by the ICE/JTAG
port.
Embedded ICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the Embedded In-Circuit-Emulator-RT, see the ARM document:
ARM9EJ-S Technical Reference Manual (
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The AT91SAM9XE Debug Unit Chip ID value is 0x0198 03A0 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
AT91SAM9XE128/256/512 Preliminary
DDI 0222A
).
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