SAM9G45 Atmel Corporation, SAM9G45 Datasheet - Page 228

no-image

SAM9G45

Manufacturer Part Number
SAM9G45
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9G45

Flash (kbytes)
0 Kbytes
Pin Count
324
Max. Operating Frequency
400 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
160
Ext Interrupts
160
Usb Transceiver
3
Usb Speed
Hi-Speed
Usb Interface
Host, Device
Spi
2
Twi (i2c)
2
Uart
5
Lin
4
Ssc
2
Ethernet
1
Sd / Emmc
2
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
Yes
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
440
Resistive Touch Screen
Yes
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
64
Self Program Memory
NO
External Bus Interface
2
Dram Memory
DDR2/LPDDR, SDRAM/LPSDR
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
0.9 to 1.1
Fpu
No
Mpu / Mmu
No/Yes
Timers
6
Output Compare Channels
6
Input Capture Channels
6
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
Glossary
Big-endian memory
Block address
Boundary scan chain
Breakpoint
Burst
Bus Interface Unit
Byte
Glossary-4
Memory in which:
- a byte or halfword at a word-aligned address is the most significant byte or halfword
within the word at that address
- a byte at a halfword-aligned address is the most significant byte within the halfword
at that address.
See also Little-endian memory.
An address that comprises a tag, an index, and a word field. The tag bits identify the way
that contains the matching cache entry for a cache hit. The index bits identify the set
being addressed. The word field contains the word address that can be used to identify
specific words, halfwords, or bytes within the cache entry.
See also Cache terminology diagram on the last page of this glossary.
A boundary scan chain is made up of serially-connected devices that implement
boundary scan technology using a standard JTAG TAP interface. Each device contains
at least one TAP controller containing shift registers that form the chain connected
between TDI and TDO, through which test data is shifted. Processors can contain
several shift registers to enable you to access selected parts of the device.
A breakpoint is a mechanism provided by debuggers to identify an instruction at which
program execution is to be halted. Breakpoints are inserted by the programmer to enable
inspection of register contents, memory locations, variable values at fixed points in the
program execution to test that the program is operating correctly. Breakpoints are
removed after the program is successfully tested.
See also Watchpoint.
A group of transfers to consecutive addresses. Because the addresses are consecutive,
there is no requirement to supply an address for any of the transfers after the first one.
This increases the speed at which the group of transfers can occur. Bursts over AHB
buses are controlled using the HBURST signals to specify if transfers are single,
four-beat, eight-beat, or 16-beat bursts, and to specify how the addresses are
incremented.
See also Beat.
The Bus Interface Unit (BIU) controls all data accesses across the AHB. It arbitrates and
schedules AHB requests.
An 8-bit data item.
Copyright © 2001-2003 ARM Limited. All rights reserved.
ARM DDI0198D

Related parts for SAM9G45