PNX1501E,557 NXP Semiconductors, PNX1501E,557 Datasheet - Page 747

• Manufacturer Part Number: PNX1501E,557
• Description: IC MEDIA PROC 266MHZ 456-BGA
• Manufacturer: NXP Semiconductors

Specifications of PNX1501E,557

• Applications: Multimedia
• Core Processor: TriMedia
• Controller Series: Nexperia
• Interface: I²C, 2-Wire Serial
• Number Of I /o: 61
• Voltage - Supply: 1.14 V ~ 1.26 V
• Operating Temperature: 0°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 456-BGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Program Memory Type: -
• Ram Size: -
• Other names: 935274728557; PNX1501E; PNX1501E

1. Introduction
2. Functional Description
2.1.1 Test Access Port (TAP)
1.1 Features
2.1 General Operations
The TM3260 Debug (TM_DBG) interface consists of the Test Access Port (TAP), the
TAP Controller, a JTAG Instruction register and internal debug registers. The TAP
controller from which the TM_DBG module receives its commands resides in the test
control block, which also facilitates boundary scanning and other DFT features.
The TM_DBG has registers that can be programmed for control and communication
with an on-chip TriMedia TM3260 CPU.
The Test Access Port (TAP) includes four dedicated input pins and one output pin:
TCK provides the clock for test logic required by the JTAG standard. TCK is
asynchronous to any system clock. Stored state devices in the JTAG controller will
retain their state indefinitely when TCK is stopped at 0 or 1.
The signal received at TMS is decoded by the TAP controller to control test functions.
The test logic is required to sample TMS at the rising edge of TCK.
Serial test instructions and test data are received at TDI. The TDI signal is required to
be sampled at the rising edge of TCK. When test data is shifted from TDI to TDO, the
data must appear without inversion at TDO after a number of rising and falling edges
of TCK determined by the length of the instruction or test data register selected.
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Chapter 24: TM3260 Debug
PNX15xx Series Data Book – Volume 1 of 1
Rev. 3 — 17 March 2006
TCK (Test Clock)
TMS (Test Mode Select)
TDI (Test Data In)
TDO (Test Data Out)
Product data sheet