AT91SAM9261SB-CU-999 Atmel, AT91SAM9261SB-CU-999 Datasheet - Page 55

• Manufacturer Part Number: AT91SAM9261SB-CU-999
• Description: IC MCU ARM9 ULTRA LP 217LFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM9261SB-CU-999

• Core Processor: ARM9
• Core Size: 16/32-Bit
• Speed: 190MHz
• Connectivity: EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
• Peripherals: DMA, LCD, POR, PWM, WDT
• Number Of I /o: 96
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: ROM
• Ram Size: 48K x 8
• Voltage - Supply (vcc/vdd): 1.08 V ~ 1.32 V
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 217-LFBGA
• Processor Series: AT91SAMx
• Core: ARM926EJ-S
• Data Bus Width: 32 bit
• Data Ram Size: 16 KB
• Interface Type: 2-Wire, I2S, SPI, USB
• Maximum Clock Frequency: 190 MHz
• Number Of Programmable I/os: 96
• Number Of Timers: 4
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP, AT91SAM9261-EK
• Minimum Operating Temperature: - 40 C
• For Use With: AT91SAM9261-EK - KIT EVAL FOR AT91SAM926EJ-SAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Data Converters: -
• Lead Free Status / Rohs Status: Details

12.3.2
12.4
6242E–ATARM–11-Sep09
Debug and Test Pin Description
Test Environment
Figure 12-3 on page 55
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
NTRST
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
AT91SAM9261S-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
Interface
AT91SAM9261S
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Test Reset Signal
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
Chip n
ICE and JTAG
Test Adaptor
Debug Unit
Reset/Test
Chip 2
Chip 1
Input/Output
Tester
AT91SAM9261S
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
Active Level
High
Low
Low
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