AT91SAM9261SB-CU-999 Atmel, AT91SAM9261SB-CU-999 Datasheet - Page 53

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AT91SAM9261SB-CU-999

Manufacturer Part Number
AT91SAM9261SB-CU-999
Description
IC MCU ARM9 ULTRA LP 217LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet

Specifications of AT91SAM9261SB-CU-999

Core Processor
ARM9
Core Size
16/32-Bit
Speed
190MHz
Connectivity
EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
DMA, LCD, POR, PWM, WDT
Number Of I /o
96
Program Memory Size
32KB (32K x 8)
Program Memory Type
ROM
Ram Size
48K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
217-LFBGA
Processor Series
AT91SAMx
Core
ARM926EJ-S
Data Bus Width
32 bit
Data Ram Size
16 KB
Interface Type
2-Wire, I2S, SPI, USB
Maximum Clock Frequency
190 MHz
Number Of Programmable I/os
96
Number Of Timers
4
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM9261-EK
Minimum Operating Temperature
- 40 C
For Use With
AT91SAM9261-EK - KIT EVAL FOR AT91SAM926EJ-SAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT91SAM9261SB-CU-999
Manufacturer:
Atmel
Quantity:
10 000
12. AT91SAM9261S Debug and Test
12.1
12.2
6242E–ATARM–11-Sep09
Overview
Block Diagram
The AT91SAM9261S features a number of complementary debug and test capabilities. A com-
mon JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
TAP: Test Access Port
PDC
ARM9EJ-S
Boundary
ARM926EJ-S
Port
DBGU
ICE-RT
ICE/JTAG
TAP
Reset
Test
and
AT91SAM9261S
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
NTRST
RTCK
TST
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