DF3048BVX25V Renesas Electronics America, DF3048BVX25V Datasheet - Page 662

MCU 3/5V 128K PB-FREE 100-TQFP

DF3048BVX25V

Manufacturer Part Number
DF3048BVX25V
Description
MCU 3/5V 128K PB-FREE 100-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8/300Hr
Datasheets

Specifications of DF3048BVX25V

Core Processor
H8/300H
Core Size
16-Bit
Speed
25MHz
Connectivity
SCI, SmartCard
Peripherals
DMA, PWM, WDT
Number Of I /o
70
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 75°C
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
DF3048BVX25V
Manufacturer:
Renesas Electronics America
Quantity:
10 000
Section 19 Clock Pulse Generator
External Clock
The external clock frequency should be equal to the system clock frequency ( ) when not divided
by the on-chip frequency divider. Table 19.4, figures 19.6 and 19.7 indicate the clock timing.
When the appropriate external clock is input via the EXTAL pin, its waveform is corrected by the
on-chip oscillator and duty adjustment circuit. The resulting stable clock is output to external
devices after the external clock settling time (t
must remain reset with the reset signal low during t
Table 19.4(1) Clock Timing for H8/3048B Group (8 MHz
Item
External clock input low
pulse width
External clock input high
pulse width
External clock rise time
External clock fall time
Clock low pulse width
Clock high pulse width
External clock output
settling delay time
Note:
Rev. 3.00 Sep 27, 2006 page 634 of 872
REJ09B0325-0300
* t
DEXT
includes a RES pulse width (t
Symbol Min
t
t
t
t
t
t
t
EXL
EXH
EXr
EXf
CL
CH
DEXT
*
t
t
0.4
0.4
500
cyc
cyc
3.0 V to 3.6 V
/2–5
/2–5
V
RESW
CC
DEXT
Max
5
5
0.6
0.6
=
). t
) has passed after the clock input. The system
RESW
DEXT
, while the clock output is unstable.
= 20 t
Min
t
t
0.4
0.4
500
cyc
cyc
cyc
/2–5
/2–5
5.0 V ±10%
f
V
CC
25 MHz)
Max
5
5
0.6
0.6
=
Unit
ns
ns
ns
ns
t
t
µs
cyc
cyc
Test
Conditions
Figure 19.6
Figure 19.7
Figure 21.7

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