ATXMEGA16A4-CUR Atmel, ATXMEGA16A4-CUR Datasheet - Page 338

MCU AVR 16+4KB FLASH 49VFBGA

ATXMEGA16A4-CUR

Manufacturer Part Number
ATXMEGA16A4-CUR
Description
MCU AVR 16+4KB FLASH 49VFBGA
Manufacturer
Atmel
Series
AVR® XMEGAr
Datasheets

Specifications of ATXMEGA16A4-CUR

Core Processor
AVR
Core Size
8/16-Bit
Speed
32MHz
Connectivity
I²C, IrDA, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
34
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.6 V ~ 3.6 V
Data Converters
A/D 12x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
49-VFBGA
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATSTK600 - DEV KIT FOR AVR/AVR32770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPI
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATXMEGA16A4-CUR
Manufacturer:
Atmel
Quantity:
10 000
28.3
8077H–AVR–12/09
TAP - Test Access Port
When using the JTAG interface for Boundary-scan, the JTAG TCK clock frequency can be
higher than the internal device frequency. The System Clock in the device is not required for
Boundary-scan.
The JTAG interface is accessed through four of the AVR's pins. In JTAG terminology, these pins
constitute the Test Access Port - TAP. These pins are:
The IEEE std. 1149.1-2001 also specifies an optional TAP signal; TRST - Test ReSeT. This is
not available.
When the JTAGEN Fuse is unprogrammed or the JTAG Disable bit is set the JTAG interface is
disabled. The four TAP pins are normal port pins and the TAP controller is in reset. When
enabled, the input TAP signals are internally pulled high and the JTAG is enabled for Boundary-
scan operations.
Figure 28-1. TAP Controller state diagram
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
• TCK: Test Clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
machine.
(Scan Chains).
XMEGA A
338

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