HD6435348R Hitachi Semiconductor, HD6435348R Datasheet - Page 330

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HD6435348R

Manufacturer Part Number
HD6435348R
Description
Single-Chip Microcomputer
Manufacturer
Hitachi Semiconductor
Datasheet
17.5 Reliability of Written Data
An effective way to assure the data holding characteristics of the programmed chips is to bake
them at 150˚C, then screen them for data errors. This procedure quickly eliminates chips with
PROM memory cells prone to early failure.
Figure 17-8 shows the recommended screening procedure.
Write program
Bake with power off
°
150
C 48 Hr
Read and check program
V
= 5.0 V
CC
Install
Figure 17-8 Recommended Screening Procedure
If a series of write errors occur while the same PROM writer is in use, stop programming and
check the PROM writer and socket adapter for defects, using a microcomputer with a windowed
package and on-chip EPROM.
Please inform Hitachi of any abnormal conditions noted during programming or in screening of
program data after high-temperature baking.
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