OR3T125-5BA352 AGERE [Agere Systems], OR3T125-5BA352 Datasheet - Page 143

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OR3T125-5BA352

Manufacturer Part Number
OR3T125-5BA352
Description
3C and 3T Field-Programmable Gate Arrays
Manufacturer
AGERE [Agere Systems]
Datasheet
Data Sheet
June 1999
Lucent Technologies Inc.
Input/Output Buffer Measurement Conditions
TO THE OUTPUT UNDER TEST
Note: Switch to V
A. Load Used to Measure Propagation Delay
DD
for T
PLZ
/T
PZL
; switch to GND for T
out[i]
out[i]
OUT
PAD
PAD IN
V
1.5 V
0.0 V
DD
V
V
DD
SS
in[i]
/2
Figure 90. Output Buffer Delays
Figure 91. Input Buffer Delays
ts[i]
V
50 pF
PHZ
3.0 V
1.5 V
0.0 V
Figure 89. ac Test Loads
DD
V
V
DD
SS
/T
/2
PZH
T
PHH
PAD
OUT
.
PAD
IN
T
ac TEST LOADS (SHOWN ABOVE)
PHH
TO THE OUTPUT UNDER TEST
T
PLL
T
PLL
B. Load Used to Measure Rising/Falling Edges
ORCA Series 3C and 3T FPGAs
in[i]
V
CC
GND
1 k
50 pF
5-3233.a(F)
5-3234(F)
5-3235(F)
143

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