SAM3U2E Atmel Corporation, SAM3U2E Datasheet - Page 230

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SAM3U2E

Manufacturer Part Number
SAM3U2E
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM3U2E

Flash (kbytes)
128 Kbytes
Pin Count
144
Max. Operating Frequency
96 MHz
Cpu
Cortex-M3
# Of Touch Channels
57
Hardware Qtouch Acquisition
No
Max I/o Pins
96
Ext Interrupts
96
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
5
Twi (i2c)
2
Uart
5
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
36
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
14.2
14.2.1
14.2.2
230
Application Examples
SAM3U Series
Debug Environment
Test Environment
Figure 14-2
standard debugging functions, such as downloading code and single-stepping through the pro-
gram and viewing core and peripheral registers.
Figure 14-2. Application Debug Environment Example
Figure 14-3
and interpreted by the tester. In this example, the “board in test” is designed using a number of
JTAG-compliant devices. These devices can be connected to form a single scan chain.
shows a complete debug environment example. The SWJ-DP interface is used for
shows a test environment example (JTAG Boundary scan). Test vectors are sent
SAM3-based Application Board
Emulator/Probe
Connector
SWJ-DP
SWJ-DP
SAM3
Host Debugger
PC
6430E–ATARM–29-Aug-11

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