AT90CAN128-15AZ Atmel, AT90CAN128-15AZ Datasheet - Page 26

MCU AVR 128K FLASH 15MHZ 64TQFP

AT90CAN128-15AZ

Manufacturer Part Number
AT90CAN128-15AZ
Description
MCU AVR 128K FLASH 15MHZ 64TQFP
Manufacturer
Atmel
Series
AVR® 90CANr
Datasheets

Specifications of AT90CAN128-15AZ

Package / Case
64-TQFP, 64-VQFP
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Operating Temperature
-40°C ~ 125°C
Speed
16MHz
Number Of I /o
53
Eeprom Size
4K x 8
Core Processor
AVR
Program Memory Type
FLASH
Ram Size
4K x 8
Program Memory Size
128KB (128K x 8)
Data Converters
A/D 8x10b
Oscillator Type
Internal
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Connectivity
CAN, I²C, SPI, UART/USART
Core Size
8-Bit
Processor Series
AT90CANx
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
4 KB
Interface Type
CAN, SPI, UART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
53
Number Of Timers
4
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATDVK90CAN1, ATADAPCAN01
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 8 Channel
Cpu Family
90C
Device Core
AVR
Device Core Size
8b
Frequency (max)
16MHz
Total Internal Ram Size
4KB
# I/os (max)
53
Number Of Timers - General Purpose
4
Operating Supply Voltage (typ)
3.3/5V
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
2.7V
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 125C
Operating Temperature Classification
Automotive
Mounting
Surface Mount
Pin Count
64
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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4.3.5
26
AT90CAN32/64/128
Preventing EEPROM Corruption
The next code examples show assembly and C functions for reading the EEPROM. The exam-
ples assume that interrupts are controlled so that no interrupts will occur during execution of
these functions.
During periods of low V
too low for the CPU and the EEPROM to operate properly. These issues are the same as for
board level systems using EEPROM, and the same design solutions should be applied.
An EEPROM data corruption can be caused by two situations when the voltage is too low. First,
a regular write sequence to the EEPROM requires a minimum voltage to operate correctly. Sec-
ondly, the CPU itself can execute instructions incorrectly, if the supply voltage is too low.
EEPROM data corruption can easily be avoided by following this design recommendation:
Keep the AVR RESET active (low) during periods of insufficient power supply voltage. This can
be done by enabling the internal Brown-out Detector (BOD). If the detection level of the internal
BOD does not match the needed detection level, an external low V
be used. If a reset occurs while a write operation is in progress, the write operation will be com-
pleted provided that the power supply voltage is sufficient.
Assembly Code Example
C Code Example
EEPROM_read:
unsigned char EEPROM_read(unsigned int uiAddress)
{
}
; Wait for completion of previous write
sbic
rjmp
; Set up address (r18:r17) in address register
out
out
; Start eeprom read by writing EERE
sbi
; Read data from data register
in
ret
/* Wait for completion of previous write */
while(EECR & (1<<EEWE));
/* Set up address register */
EEAR = uiAddress;
/* Start eeprom read by writing EERE */
EECR |= (1<<EERE);
/* Return data from data register */
return EEDR;
EECR,EEWE
EEPROM_read
EEARH, r18
EEARL, r17
EECR,EERE
r16,EEDR
CC,
the EEPROM data can be corrupted because the supply voltage is
CC
reset Protection circuit can
7679H–CAN–08/08

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