AT91SAM9R64-CU Atmel, AT91SAM9R64-CU Datasheet - Page 71

• Manufacturer Part Number: AT91SAM9R64-CU
• Description: MCU ARM9 64K SRAM 144-LFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM9R64-CU

• Core Processor: ARM9
• Core Size: 16/32-Bit
• Speed: 240MHz
• Connectivity: EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
• Peripherals: AC'97, POR, PWM, WDT
• Number Of I /o: 49
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: ROM
• Ram Size: 72K x 8
• Voltage - Supply (vcc/vdd): 1.08 V ~ 1.32 V
• Data Converters: A/D 3x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 144-LFBGA
• Processor Series: AT91SAMx
• Core: ARM926EJ-S
• Data Bus Width: 32 bit
• Data Ram Size: 64 KB
• Interface Type: 2-Wire, SPI, SSC, USART
• Maximum Clock Frequency: 240 MHz
• Number Of Programmable I/os: 118
• Number Of Timers: 4
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP, AT91SAM9RL-EK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 3 Channel
• Controller Family/series: AT91SAM9xxx
• No. Of I/o's: 49
• Ram Memory Size: 64KB
• Cpu Speed: 240MHz
• No. Of Timers: 3
• Rohs Compliant: Yes
• Package: 144LFBGA
• Device Core: ARM926EJ-S
• Family Name: 91S
• Maximum Speed: 240 MHz
• Operating Supply Voltage: 1.8|3.3 V
• For Use With: AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

13.5.3
13.5.4
13.5.5
6289C–ATARM–28-May-09
JTAG Signal Description
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
TMS is the Test Mode Select input which controls the transitions of the test interface state
machine.
TDI is the Test Data Input line which supplies the data to the JTAG registers (Boundary Scan
Register, Instruction Register, or other data registers).
TDO is the Test Data Output line which is used to serially output the data from the JTAG regis-
ters to the equipment controlling the test. It carries the sampled values from the boundary scan
chain (or other JTAG registers) and propagates them to the next chip in the serial test circuit.
NTRST (optional in IEEE Standard 1149.1) is a Test-ReSeT input which is mandatory in ARM
cores and used to reset the debug logic. On Atmel ARM926EJ-S-based cores, NTRST is a
Power On Reset output. It is asserted on power on. If necessary, the user can also reset the
debug logic with the NTRST pin assertion during 2.5 MCK periods.
TCK is the Test ClocK input which enables the test interface. TCK is pulsed by the equipment
controlling the test and not by the tested device. It can be pulsed at any frequency. Note the
maximum JTAG clock rate on ARM926EJ-S cores is 1/6th the clock of the CPU. This gives 5.45
kHz maximum initial JTAG clock rate for an ARM9E running from the 32.768 kHz slow clock.
RTCK is the Return Test Clock. Not an IEEE Standard 1149.1 signal added for a better clock
handling by emulators. From some ICE Interface probes, this return signal can be used to syn-
chronize the TCK clock and take not care about the given ratio between the ICE Interface clock
and system clock equal to 1/6th. This signal is only available in JTAG ICE Mode and not in
boundary scan mode.
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The AT91SAM9R64/RL64 Debug Unit Chip ID value is 0x0196 07A0 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1
JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be per-
formed after JTAGSEL is changed.
AT91SAM9R64/RL64 Preliminary
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