AT32AP7001-ALUT Atmel, AT32AP7001-ALUT Datasheet - Page 779

IC MCU 32BIT AVR32 208-LQFP

AT32AP7001-ALUT

Manufacturer Part Number
AT32AP7001-ALUT
Description
IC MCU 32BIT AVR32 208-LQFP
Manufacturer
Atmel
Series
AVR®32 AP7r
Datasheets

Specifications of AT32AP7001-ALUT

Core Processor
AVR
Core Size
32-Bit
Speed
150MHz
Connectivity
EBI/EMI, I²C, MMC, PS2, SPI, SSC, UART/USART, USB
Peripherals
AC'97, DMA, I²C, POR, PWM, WDT
Number Of I /o
90
Program Memory Type
ROMless
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
D/A 2x16b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
208-LQFP
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
EBI, ISI, MCI, PS2, SPI, TWI, USB
Maximum Clock Frequency
150 MHz
Number Of Programmable I/os
90
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Dac
16 bit, 1 Channel
Package
208PQFP
Device Core
AVR32
Family Name
AT32
Maximum Speed
150 MHz
Operating Supply Voltage
1.8 V
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATNGW100 - KIT AVR32 NETWORK GATEWAYATSTK1000 - KIT STARTER FOR AVR32AP7000
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Lead Free Status / Rohs Status
 Details

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37.4.2
37.4.2.1
Figure 37-3. Scanning in JTAG instruction
37.4.2.2
37.4.3
32015G–AVR32–09/09
Typical sequence
Boundary-Scan
Scanning in JTAG instruction
Scanning in/out data
TCK
TAP State
TMS
TDI
TDO
TLR
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register - Shift-IR state. While in this state, shift the 5 bits of the JTAG instructions
into the JTAG instruction register from the TDI input at the rising edge of TCK. The TMS input
must be held low during input of the 4 LSBs in order to remain in the Shift-IR state. The JTAG
Instruction selects a particular Data Register as path between TDI and TDO and controls the cir-
cuitry surrounding the selected Data Register.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is latched
onto the parallel output from the shift register path in the Update-IR state. The Exit-IR, Pause-IR,
and Exit2-IR states are only used for navigating the state machine.
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift Data
Register - Shift-DR state. While in this state, upload the selected Data Register (selected by the
present JTAG instruction in the JTAG Instruction Register) from the TDI input at the rising edge
of TCK. In order to remain in the Shift-DR state, the TMS input must be held low. While the Data
Register is shifted in from the TDI pin, the parallel inputs to the Data Register captured in the
Capture-DR state is shifted out on the TDO pin.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected Data Register
has a latched parallel-output, the latching takes place in the Update-DR state. The Exit-DR,
Pause-DR, and Exit2-DR states are only used for navigating the state machine.
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
JTAG instruction and using Data Registers.
The Boundary-Scan chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
off-chip connections. At system level, all ICs having JTAG capabilities are connected serially by
the TDI/TDO signals to form a long shift register. An external controller sets up the devices to
drive values at their output pins, and observe the input values received from other devices. The
controller compares the received data with the expected result. In this way, Boundary-Scan pro-
vides a mechanism for testing interconnections and integrity of components on Printed Circuits
Boards by using the 4 TAP signals only.
RTI
SelDR SelIR CapIR ShIR
Instruction
ImplDefined
Ex1IR UpdIR RTI
AT32AP7001
779

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