AMD-K6-2E/400AFR AMD [Advanced Micro Devices], AMD-K6-2E/400AFR Datasheet - Page 245

• Manufacturer Part Number: AMD-K6-2E/400AFR
• Manufacturer: AMD [Advanced Micro Devices]

22529B/0—January 2000
12
12.1
Chapter 12
Test and Debug
Built-In Self-Test (BIST)
The AMD-K6-2E processor implements various test and debug
modes to enable the functional and manufacturing testing of
systems and boards that use the processor. In addition, the
debug features of the processor allow designers to debug the
instruction execution of software components. This chapter
describes the following test and debug features:
Following the falling transition of RESET, the processor
unconditionally runs its built-in self test (BIST). The internal
resources tested during BIST include the following:
The contents of the EAX general-purpose register after the
completion of reset indicate if the BIST was successful.
Following the completion of the BIST, the processor jumps to
address FFFF_FFF0h to start instruction execution, regardless
of the outcome of the BIST. The BIST takes approximately
295,000 processor clocks to complete.
Built-In Self-Test (BIST)—The BIST, which is invoked after
the falling transition of RESET, runs internal tests that
exercise most on-chip RAM structures.
Three-State Test Mode—A test mode that causes the
processor to float its output and bidirectional pins.
Boundary-Scan Test Access Port (TAP) —The Joint Test
Action Group (JTAG) test access function defined by the
IEEE
Architecture (IEEE 1149.1-1990) specification.
Level-One (L1) Cache Inhibit—A feature that disables the
processor’s internal L1 instruction and data caches.
Debug Support—Consists of all x86-compatible software
debug features, including the debug extensions.
L1 instruction and data caches
Instruction and Data Translation Lookaside Buffers (TLBs)
If EAX contains 0000_0000h, then BIST was successful.
If EAX is non-zero, the BIST failed.
Standard
Test and Debug
Test
Access
AMD-K6™-2E Processor Data Sheet
Port
and
Boundary-Scan
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