STEVAL-ISB005V1 STMicroelectronics, STEVAL-ISB005V1 Datasheet - Page 118
STEVAL-ISB005V1
Manufacturer Part Number
STEVAL-ISB005V1
Description
BOARD EVAL CHARGER ST7260/L6924D
Manufacturer
STMicroelectronics
Type
Battery Managementr
Specifications of STEVAL-ISB005V1
Main Purpose
Power Management, Battery Charger
Embedded
Yes, MCU, 8-Bit
Utilized Ic / Part
L6924, ST72F63BK6M1
Primary Attributes
1 Cell- Li-Ion / Li-Pol, 5 V (USB Input)
Secondary Attributes
Powered by Wall Adaptor Also, LED Status Indicators
Input Voltage
5 V
Product
Power Management Modules
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
L6924D, ST7260
Other names
497-8428
Available stocks
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Manufacturer
Quantity
Price
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Electrical characteristics
16.7
16.7.1
16.7.2
118/139
EMC characteristics
Susceptibility and emission tests are performed on a sample basis during product
characterization.
Functional EMS (electromagnetic susceptibility)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electromagnetic events until a failure occurs (indicated by the
LEDs).
●
●
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations:
The software flowchart must include the management of runaway conditions such as:
●
●
●
Prequalification trials:
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behaviour is detected, the software can be
hardened to prevent unrecoverable errors occurring (see application note AN1015).
ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test conforms with the IEC 1000-4-2
standard.
FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test
conforms with the IEC 1000-4-4 standard.
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
ST7260xx
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