PEB20256E-V21 Infineon Technologies, PEB20256E-V21 Datasheet - Page 113

• Manufacturer Part Number: PEB20256E-V21
• Description: IC CONTROLLER INTERFACE 388-BGA
• Manufacturer: Infineon Technologies

Specifications of PEB20256E-V21

• Function: Multichannel Network Interface Controller (MUNICH)
• Interface: HDLC, PPP, Serial, TMA
• Voltage - Supply: 3 V ~ 3.6 V
• Current - Supply: 200mA
• Power (watts): 3W
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 388-BBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Number Of Circuits: -
• Other names: PEB20256E-V21; PEB20256E-V21IN

•
Figure 5-15
If no boundary scan operation is planned TRST has to be connected with V
TDI do not need to be connected since pull- up transistors ensure high input levels in this
case. Nevertheless it would be a good practice to put the unused inputs to defined levels.
In this case, if the JTAG is not used:
TMS = TCK = ‘1’ is recommended.
Test handling (boundary scan operation) is performed via the pins TCK (Test Clock),
TMS (Test Mode Select), TDI (Test Data Input) and TDO (Test Data Output) when the
TAP controller is not in its reset state, i. e. TRST is connected to V
unconnected due to its internal pull up. Test data at TDI are loaded with a clock signal
connected to TCK. ‘1’ or ‘0’ on TMS causes a transition from one controller state to
another; constant ‘1’ on TMS leads to normal operation of the chip.
An input pin (I) uses one boundary scan cell (data in), an output pin (O) uses two cells
(data out, enable) and an I/O-pin (I/O) uses three cells (data in, data out, enable). Note
that most functional output and input pins of the MUNICH256 are tested as I/O pins in
boundary scan, hence using three cells. The boundary scan unit of the MUNICH256
contains a total of n = 484 scan cells. The desired test mode is selected by serially
loading a 4-bit instruction code into the instruction register via TDI (LSB first).
EXTEST is used to examine the interconnection of the devices on the board. In this test
mode at first all input pins capture the current level on the corresponding external
interconnection line, whereas all output pins are held at constant values (‘0’ or ‘1’). Then
the contents of the boundary scan is shifted to TDO. At the same time the next scan
vector is loaded from TDI. Subsequently all output pins are updated according to the new
Data Sheet
Block Diagram of Test Access Port and Boundary Scan Unit
TCK
TRST
TMS
TDI
TDO
CLOCK
Reset
Test
Control
Data in
Enable
Data out
Test Access Port (TAP)
- Finite State Machine
- Instruction Register (4 bit)
- Test Signal Generator
Clock Generation
TAP Controller
CLOCK
113
ID Data out
Control
Bus
SS Data
out
Interface Description
DD3
PEB 20256 E
2
PEF 20256 E
1
n
Pins
.
.
.
.
.
.
or it remains
SS
. TMS and
04.2001