MT90869AG Zarlink, MT90869AG Datasheet - Page 45

• Manufacturer Part Number: MT90869AG
• Description: Switch Fabric 16K x 16K/8K x 8K 1.8V/3.3V 272-Pin BGA Tray
• Manufacturer: Zarlink

Specifications of MT90869AG

• Package: 272BGA
• Number Of Ports: 64
• Fabric Size: 16K x 16K|8K x 8K
• Switch Core: Non-Blocking|Blocking
• Port Speed: 8.192|4.096|2.048 Mbps
• Operating Supply Voltage: 1.8|3.3 V

10.0
As operation of the memory BIST will corrupt existing data, this test must only be instigated when the device is
placed “out-of-service” or isolated from live traffic.
The memory BIST mode is enabled through the microprocessor port (Section 13.14, Memory BIST Register).
Internal BIST memory controllers generate the memory test pattern (S-march) and control the memory test. The
memory test result is monitored through the Memory BIST Register when controlled via the microprocessor
interface.
11.0
The MT90869 JTAG interface conforms to the Boundary-Scan IEEE 1149.1 standard. The operation of the
boundary-scan circuit shall be controlled by an external Test Access Port (TAP) Controller. JTAG is intended to be
used during the development cycle. The JTAG interface is operational when the MT90869 core (V
powered at typical voltage levels.
11.1
The Test Access Port (TAP) consists of four input pins and one output pin described as follows:
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11.2
The MT90869 uses the public instructions defined in the IEEE 1149.1 standard with the provision of an Instruction
Register and three Test Data Registers.
11.2.1
The JTAG interface contains a four-bit instruction register. Instructions are serially loaded into the Instruction
Register from the TDi pin when the TAP Controller is in the shift-IR state. Instructions are subsequently decoded to
achieve two basic functions: to select the Test Data Register to operate while the instruction is current, and to
define the serial Test Data Register path to shift data between TDi and TDo during data register scanning.
Test Clock Input (TCK)
TCK provides the clock for the TAP Controller and is independent of any on-chip clock. TCK permits the
shifting of test data into or out of the Boundary-Scan register cells under the control of the TAP Controller in
Boundary-Scan Mode.
Test Mode Select Input (TMS)
The TAP controller uses the logic signals applied to the TMS input to control test operations. The TMS
signals are sampled at the rising edge of the TCK pulse. This pin in internally pulled to V
driven from an external source.
Test Data Input (TDi)
Depending on the previously applied data to the TMS input, the serial input data applied to the TDi port is
connected either to the Instruction Register or to a Test Data Register. Both registers are described in a
Section 11.2, TAP Registers. The applied input data is sampled at the rising edge of TCK pulses. This pin is
internally pulled to V
Test Data Output (TDo)
Depending on the previously applied sequence to the TMS input, the contents of either the instruction
register or data register are serially shifted out towards the TDo. The data out of the TDo is clocked on the
falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the TDo output is
set to a high impedance state.
Test Reset (TRST)
TRST provides an asynchronous Reset to the JTAG scan structure. This pin is internally pulled to V
when not driven from an external source.
Test Access Port (TAP)
TAP Registers
Memory Built-In-Self-Test (BIST) Mode
JTAG Port
Test Instruction Register
DD_IO
when not driven from an external source.
Zarlink Semiconductor Inc.
MT90869
45
DD_IO
Data Sheet
when not
DD
-core) is
DD_IO