PNX1501E NXP Semiconductors, PNX1501E Datasheet - Page 73

• Manufacturer Part Number: PNX1501E
• Description: Digital Signal Processors & Controllers (DSP, DSC) MEDIA PROCESSOR PNX15XX/266MHZ
• Manufacturer: NXP Semiconductors

Specifications of PNX1501E

• Product: DSPs
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: SOT-795
• Minimum Operating Temperature: 0 C
• Lead Free Status / Rohs Status: Details
• Other names: PNX1501E,557

Philips Semiconductors
Volume 1 of 1
11. Miscellaneous
12. Soft Errors Due to Radiation
13. Ordering Information
Table 39: Ordering Information
12NC 9397 750 14321
Product data sheet
Part Name
PNX1500E
PNX1501E
PNX1502E
PNX1500E/G
PNX1501E/G
PNX1502E/G
12 NC
12NC 9352 729 05557 240 MHz 1.2-V
12NC 9352 747 28557 266 MHz 1.2-V
12NC 9352 747 44557 300 MHz 1.3-V
12NC 9352 777 46557 240 MHz 1.2-V
12NC 9352 777 47557 266 MHz 1.2-V
12NC 9352 777 48557 300 MHz 1.3-V
In order to limit clock jitter on the TM3260 and DDR clocks, it is recommended to
shutdown the clocks of the unused modules, typically by programming these modules
to enter the powerdown mode and switch the others to their functional clocks (i.e.
switch the module’s clocks to a frequency higher than the default 27 MHz crystal
clock when possible).
Soft errors can be caused by radiation, electromagnetic interference, or electrical
noise. This section reports the soft error rate (SER) caused by the radiation
component.
There are three primary radiation sources namely alpha particles, high-energy
cosmic rays, and neutron-induced boron fission. Alpha particles originate from
radioactive impurities in chip and package materials. Cosmic rays indirectly generate
charges by colliding with nuclei within the chip. The boron fission occurs when a low-
energy (thermal) neutron hits a 10B nucleus, which then breaks up into an alpha and
lithium recoil. The SER generated by these radiation sources is of 9900 Failure-In-
Time (FIT) which is equivalent to one failure every 10 years.
In the PNX1500, the SER is statistically improved since some of the memory
elements (that are affected by the radiation) may contain pixel data rather than control
data which further extends the SER.
Speed
Rev. 2 — 1 December 2004
Core
Voltage
Package
BGA456
BGA456
BGA456
BGA456
BGA456
BGA456
Version
SOT795
SOT795
SOT795
SOT795
SOT795
SOT795
© Koninklijke Philips Electronics N.V. 2002-2003-2004. All rights reserved.
Chapter 1: Integrated Circuit Data
PNX15xx Series
Leadfree End of Life
NO
NO
NO
YES
YES
YES
30 June 2005
30 June 2005
30 June 2005
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