EP2AGX190FF35C6N Altera, EP2AGX190FF35C6N Datasheet - Page 295
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EP2AGX190FF35C6N
Manufacturer Part Number
EP2AGX190FF35C6N
Description
IC ARRIA II GX 190K 1152FBGA
Manufacturer
Altera
Series
Arria II GXr
Datasheets
1.EP2AGX45CU17C6N.pdf
(96 pages)
2.EP2AGX45CU17C6N.pdf
(14 pages)
3.EP2AGX45CU17C6N.pdf
(692 pages)
4.EP2AGX45CU17C6N.pdf
(10 pages)
5.EP2AGX45CU17C6N.pdf
(88 pages)
6.EP2AGX190FF35C6N.pdf
(306 pages)
Specifications of EP2AGX190FF35C6N
Number Of Logic Elements/cells
181165
Number Of Labs/clbs
7612
Total Ram Bits
9939
Number Of I /o
612
Voltage - Supply
0.87 V ~ 0.93 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-FBGA
Family Name
Arria® II GX
Number Of Logic Blocks/elements
190300
# I/os (max)
612
Frequency (max)
400MHz
Operating Supply Voltage (typ)
900mV
Logic Cells
190300
Ram Bits
10380902.4
Operating Supply Voltage (min)
0.87V
Operating Supply Voltage (max)
0.93V
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
1152
Package Type
FC-FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
- EP2AGX45CU17C6N PDF datasheet
- EP2AGX45CU17C6N PDF datasheet #2
- EP2AGX45CU17C6N PDF datasheet #3
- EP2AGX45CU17C6N PDF datasheet #4
- EP2AGX45CU17C6N PDF datasheet #5
- EP2AGX190FF35C6N PDF datasheet #6
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© July 2010
AIIGX51011-3.0
Altera Corporation
f
This chapter describes the boundary-scan test (BST) features that are supported in
Arria
document.
This chapter includes the following sections:
■
■
■
■
Arria II GX devices support IEEE Std. 1149.1 and IEEE Std. 1149.6. The IEEE Std.
1149.6 is only supported on the high-speed serial interface (HSSI) transceivers in
Arria II GX devices. The IEEE Std. 1149.6 enables board-level connectivity checking
between transmitters and receivers that are AC coupled (connected with a capacitor
in series between the source and destination).
For information about the following topics, refer to the
Boundary-Scan Testing for Arria GX Devices
“IEEE Std. 1149.6 Boundary-Scan Register”
“BST Operation Control” on page 11–3
“I/O Voltage Support in a JTAG Chain” on page 11–5
“Boundary-Scan Description Language Support” on page 11–6
■
■
■
■
■
®
IEEE Std. 1149.1 BST architecture and circuitry
TAP controller state-machine
IEEE Std. 1149.1 JTAG instructions
JTAG instructions code with descriptions
IEEE Std. 1149.1 BST guidelines
II GX devices. The features are similar to Arria GX devices, unless stated in this
11. JTAG Boundary-Scan Testing
chapter:
IEEE 1149.1 (JTAG)
Arria II GX Device Handbook, Volume 1
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