QT2032-EKG-1A2 Applied Micro Circuits Corporation, QT2032-EKG-1A2 Datasheet - Page 107

• Manufacturer Part Number: QT2032-EKG-1A2
• Manufacturer: Applied Micro Circuits Corporation

Specifications of QT2032-EKG-1A2

• Lead Free Status / RoHS Status: Supplier Unconfirmed

11.8.2 TAP Port
Table 44 lists the supported BSCAN instructions while Table 45 lists the unsupported BSCAN instructions..
Table 44: Supported BSCAN Instructions
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Table 45: Unsupported BSCAN Instructions
11.8.3 Device ID register
Table 46: Device ID Register
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Revision 5.11
BSCAN Instruction
BYPASS
EXTEST
IDCODE
SAMPLE/PRELOAD
RUNBIST
DEBUGBIST
SCAN
EXTEST_TRAIN
EXTEST_PULSE
BSCAN Instruction
CLAMP
HIGHZ
INTEST
USERCODE
Field
Manufacturer’s ID code (11bits)
Part-number code (16 bits)
Version code (4 bits)
AppliedMicro - Confidential & Proprietary
Value
5’b11111
5’b00000
5’b00001
5’b00010
5’b00011
5’b00100
5’b01001
5’b00110
5’b00101
Description
allows outputs to be forced to specific states during BYPASS
allows outputs to be forced into high-z state
allows testing of internal circuitry using BSCAN chain
allows a user-programmable ID code
Value
11’b0101_0110100
16’h2032 (16’b0010_0000_0011_0010)
4’hA (4’b1010)
Description
bypasses the bscan register
DC test of external connectivity to I/O
allows reading the device ID register
captures and updates data
runs BIST on internal memories
debug mode of memory BIST
SCAN test on digital core
AC test of external connectivity to I/O
AC test of external connectivity to I/O
QT2022/32 - Data Sheet: DS3051
107