LPC3130 Philips Semiconductors (Acquired by NXP), LPC3130 Datasheet - Page 53

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LPC3130

Manufacturer Part Number
LPC3130
Description
Manufacturer
Philips Semiconductors (Acquired by NXP)
Datasheet

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NXP Semiconductors
Table 18.
C
[1]
Table 19:
LPC3130_3131_0
Preliminary data sheet
Symbol
t
t
t
V
t
t
t
t
t
t
Symbol
f
t
r
f
FRFM
FEOPT
FDEOP
JR1
JR2
EOPR1
EOPR2
s
conv
Fig 23. Differential data-to-EOP transition skew and EOP width
L
CRS
= 50 pF; R
Characterized but not implemented as production test. Guaranteed by design.
t
PERIOD
differential
data lines
Dynamic characteristics: USB pins (high-speed)
Dynamic characteristics: 10-bit ADC
pu
= 1.5 k
9.6 USB interface
9.7 10-bit ADC
Parameter
rise time
fall time
differential rise and fall time
matching
output signal crossover voltage
source SE0 interval of EOP
source jitter for differential transition
to SE0 transition
receiver jitter to next transition
receiver jitter for paired transitions
EOP width at receiver
EOP width at receiver
Parameter
sampling frequency
conversion time
Ω
on D+ to V
n × t
differential data to
crossover point
DD(3V3)
SE0/EOP skew
PERIOD
, unless otherwise specified.
+ t
FDEOP
Conditions
10 bit resolution
2 bit resolution
10 bit resolution
2 bit resolution
Rev. 0.08 — 25 September 2008
10 % to 90 %
Conditions
10 % to 90 %
10 % to 90 %
see
see
must reject as
EOP; see
Figure 23
must accept as
EOP; see
Figure 23
t
r
/ t
Figure 23
Figure 23
f
Min
400
-
-
3
crossover point
extended
Typ
-
-
-
-
[1]
[1]
Min
<tbd>
<tbd>
-
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
Max
-
1500
11
-
LPC3130/3131
source EOP width: t
receiver EOP width: t
Typ
-
-
-
-
-
-
-
-
-
-
Unit
k samples/s
k samples/s
clock cycles
clock cycles
© NXP B.V. 2008. All rights reserved.
Max
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
<tbd>
-
-
FEOPT
002aab561
EOPR1
, t
EOPR2
53 of 60
Unit
ns
ns
%
V
ns
ns
ns
ns
ns
ns

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