82P2282PF IDT, Integrated Device Technology Inc, 82P2282PF Datasheet - Page 362

• Manufacturer Part Number: 82P2282PF
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of 82P2282PF

• Screening Level: Industrial
• Pin Count: 100
• Mounting: Surface Mount
• Package Type: TQFP
• Operating Temperature (min): -40C
• Operating Temperature (max): 85C
• Lead Free Status / RoHS Status: Not Compliant

IDT82P2282
Table 85: TAP Controller State Description (Continued)
IEEE STD 1149.1 JTAG Test Access Port
Update-IR The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK. When the new
Pause-IR The pause state allows the test controller to temporarily halt the shifting of data through the instruction register. The test data register selected by the cur-
Exit2-IR
State
rent instruction retains its previous value and the instruction does not change during this state. The controller remains in this state as long as TMS is low.
When TMS goes high and a rising edge is applied to TCK, the controller moves to the Exit2-IR state.
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR state, which
terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state. The test data register
selected by the current instruction retains its previous value and the instruction does not change during this state.
instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction retain their previous value.
362
Description
DUAL T1/E1/J1 LONG HAUL / SHORT HAUL TRANSCEIVER
August 20, 2009