MT58L1MY18D Micron Semiconductor Products, Inc., MT58L1MY18D Datasheet - Page 27

no-image

MT58L1MY18D

Manufacturer Part Number
MT58L1MY18D
Description
18Mb Syncburst SRAM, 3.3V Vdd, 3.3V or 2.5V I/O; 2.5V Vdd, 2.5V I/O, Pipelined, Dcd,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT58L1MY18DF-6
Manufacturer:
MICRON/美光
Quantity:
20 000
3.3V TAP AC Test Conditions
Input pulse levels ........................................... V
Input rise and fall times ..............................................1ns
Input timing reference levels.................................... 1.5V
Output reference levels ............................................. 1.5V
Test load termination supply voltage ...................... 1.5V
Table 20: 3.3V V
0ºC £ T
Table 21: 2.5V V
0ºC £ T
NOTE:
18Mb: 1 Meg x 18, 512K x 32/36, Pipelined, DCD SyncBurst SRAM
MT58L1MY18D_16_D.fm – Rev. D, Pub 2/03
1. All voltages referenced to V
2. TAP control balls only. For boundary scan ball specifications, please refer to the I/O DC Electrical Characteristics and
DESCRIPTION
DESCRIPTION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
3.3V TAP AC Output Load Equivalent
Operation Conditions tables.
A
A
£ +70ºC; V
£ +70ºC; V
TDO
DD
DD
= 3.3V ±0.165V unless otherwise noted
= 2.5V ±0.125V unless otherwise noted
Figure 18:
Z = 50
O
DD
DD
, TAP DC Electrical Characteristics and Operating Conditions
, TAP DC Electrical Characteristics and Operating Conditions
SS
(GND).
0V £ V
0V £ V
1.5V
Output(s) disabled,
Output(s) disabled,
0V £ V
CONDITIONS
I
0V £ V
CONDITIONS
I
I
OHC
I
OHC
I
OLC
I
OLC
I
OHT
I
OHT
20pF
OLT
50
OLT
IN
IN
= -100µA
= 100µA
= -100µA
£ V
= 100µA
£ V
= 2mA
= -2mA
= -2mA
= 2mA
IN
IN
£ V
DD
SS
£ V
DD
to 3.0V
(TDO)
DD
(TDO)
DD
27
PIPELINED, DCD SYNCBURST SRAM
SYMBOL
SYMBOL
2.5V TAP AC Test Conditions
Input pulse levels............................................ V
Input rise and fall times ............................................. 1ns
Input timing reference levels.................................. 1.25V
Output reference levels ........................................... 1.25V
Test load termination supply voltage .................... 1.25V
18Mb: 1 MEG x 18, 512K x 32/36
V
V
V
V
V
V
V
V
2.5V TAP AC Output Load Equivalent
V
V
IL
V
IL
IL
V
OH1
OH2
OL1
OL2
IL
OH1
OH2
OL1
OL2
IH
IL
IH
O
IL
O
I
I
Micron Technology, Inc., reserves the right to change products or specifications without notice.
TDO
MIN
MIN
-0.3
-10
-10
-0.3
2.0
2.9
2.0
-10
-10
1.7
2.1
1.7
Figure 19:
Z = 50
O
V
V
DD
DD
MAX
MAX
0.8
0.7
0.8
10
10
0.2
0.7
0.7
10
10
+ 0.3
+ 0.3
1.25V
UNITS
UNITS
µA
µA
µA
µA
V
V
V
V
V
V
V
V
V
V
V
V
©2003 Micron Technology, Inc.
20pF
50
SS
NOTES
NOTES
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
to 2.5V
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
2
2
2
2

Related parts for MT58L1MY18D