SAM3U4E Atmel Corporation, SAM3U4E Datasheet - Page 231
SAM3U4E
Manufacturer Part Number
SAM3U4E
Description
Manufacturer
Atmel Corporation
Specifications of SAM3U4E
Flash (kbytes)
256 Kbytes
Pin Count
144
Max. Operating Frequency
96 MHz
Cpu
Cortex-M3
# Of Touch Channels
57
Hardware Qtouch Acquisition
No
Max I/o Pins
96
Ext Interrupts
96
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
5
Twi (i2c)
2
Uart
5
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
50
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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14.3
14.4
14.4.1
6430E–ATARM–29-Aug-11
Debug and Test Pin Description
Functional Description
Test Pin
Figure 14-3. Application Test Environment Example
Table 14-1.
Note:
One dedicated pin, TST, is used to define the device operating mode. When this pin is at low
level during power-up, the device is in normal operating mode. When at high level, the device is
in test mode or FFPI mode. The TST pin integrates a permanent pull-down resistor of about
15 kΩ, so that it can be left unconnected for normal operation. Note that when setting the TST pin
Signal Name
NRST
TST
TCK/SWCLK
TDI
TDO/TRACESWO
TMS/SWDIO
JTAGSEL
1. TDO pin is set in input mode when the Cortex-M3 Core is not in debug mode. Thus an external
pull-up (100 kΩ) must be added to avoid current consumption due to floating input.
Debug and Test Signal List
SAM3-based Application Board In Test
Connector
JTAG
Probe
JTAG
Function
Microcontroller Reset
Test Select
Test Clock/Serial Wire Clock
Test Data In
Test Data Out/Trace Asynchronous
Data Out
Test Mode Select/Serial Wire
Input/Output
JTAG Selection
SAM3
Chip n
SWD/JTAG
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Type
Input
Input
Input
Input
Input
SAM3U Series
(1)
Active Level
High
Low
231
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