ATmega406 Atmel Corporation, ATmega406 Datasheet - Page 171

• Manufacturer Part Number: ATmega406
• Manufacturer: Atmel Corporation

Specifications of ATmega406

• Flash (kbytes): 40 Kbytes
• Pin Count: 48
• Max. Operating Frequency: 1 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 8
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 18
• Ext Interrupts: 4
• Usb Speed: No
• Usb Interface: No
• Twi (i2c): 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 11
• Adc Resolution (bits): 12
• Adc Speed (ksps): 1.9
• Resistive Touch Screen: No
• Temp. Sensor: Yes
• Crypto Engine: No
• Sram (kbytes): 2
• Eeprom (bytes): 512
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -30 to 85
• I/o Supply Class: 4.0 to 25
• Operating Voltage (vcc): 4.0 to 25
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 2
• Output Compare Channels: 3
• Pwm Channels: 2
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

26. JTAG Interface and On-chip Debug System
26.1
26.2
26.3
2548E–AVR–07/06
Features
Overview
Test Access Port – TAP
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The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip debugging
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface can be found in the section
211. The On-chip Debug support is considered being private JTAG instructions, and distributed
within ATMEL and to selected third party vendors only.
Figure 26-1
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI – input and TDO – output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The JTAG Programming Interface (actually consisting of several physical and virtual Data Reg-
isters) is used for serial programming via the JTAG interface. The Internal Scan Chain and
Break Point Scan Chain are used for On-chip debugging only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
• TCK: Test Clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
machine.
(Scan Chains).
JTAG (IEEE std. 1149.1 Compliant) Interface
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
shows a block diagram of the JTAG interface and the On-chip Debug system. The
®
”Programming via the JTAG Interface” on page
ATmega406
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