JS28F512P33BFD Micron Technology Inc, JS28F512P33BFD Datasheet - Page 49

• Manufacturer Part Number: JS28F512P33BFD
• Manufacturer: Micron Technology Inc

Specifications of JS28F512P33BFD

• Cell Type: NOR
• Density: 512Mb
• Access Time (max): 105/17ns
• Interface Type: Parallel/Serial
• Boot Type: Bottom
• Address Bus: 25b
• Operating Supply Voltage (typ): 2.5/3.3V
• Operating Temp Range: -40C to 85C
• Package Type: TSOP
• Program/erase Volt (typ): 8.5 to 9.5V
• Sync/async: Async/Sync
• Operating Temperature Classification: Industrial
• Operating Supply Voltage (min): 2.3V
• Operating Supply Voltage (max): 3.6V
• Word Size: 16b
• Number Of Words: 32M
• Supply Current: 31mA
• Mounting: Surface Mount
• Pin Count: 56
• Lead Free Status / RoHS Status: Supplier Unconfirmed

P33-65nm
15.0
15.1
Figure 15: AC Input/Output Reference Waveform
Note:
Figure 16: Transient Equivalent Testing Load Circuit
Notes:
1.
2.
3.
.
Table 23: Test Configuration Component Value for Worst-Case Speed Conditions
Datasheet
51
VCCQ Min Standard Test
AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input
rise and fall times (10% to 90%) < 5ns. Worst-case speed occurs at VCC = VCCMin.
See the following table for component values.
Test configuration component value for worst-case speed conditions.
C
L
includes jig capacitance.
V
0V
CCQ
AC Characteristics
AC Test Conditions
Test Configuration
Input V
CCQ
/2
Under Test
Device
Test Points
C
L
C
Out
V
L
(pF)
30
CCQ
/2 Output
Order Number:208043-05
IO_REF.WMF
Apr 2010