UJA1065 NXP Semiconductors, UJA1065 Datasheet - Page 67

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UJA1065

Manufacturer Part Number
UJA1065
Description
Manufacturer
NXP Semiconductors
Datasheet

Specifications of UJA1065

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NXP Semiconductors
11. Test information
UJA1065_7
Product data sheet
Fig 27. Timing test circuit for LIN transceiver
Fig 28. Timing diagram LIN transceiver
receiving
receiving
LIN BUS
V
node 1
node 2
V
BAT42
signal
TXDL
V
V
11.1 Quality information
RXDL1
RXDL2
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q100 - Stress test qualification for integrated circuits, and is suitable for
use in automotive applications.
t
bit
t
p(rx)f
t
t
bus(dom)(max)
bus(dom)(min)
20 pF
Rev. 07 — 25 February 2010
RXDL
TXDL
t
t
bit
p(rx)r
t
p(rx)r
BAT42
SBC
GND
t
t
bus(rec)(min)
bus(rec)(max)
High-speed CAN/LIN fail-safe system basis chip
RTLIN
LIN
t
bit
t
p(rx)f
001aad179
R1
001aaa346
R2
C1
V
V
V
V
th(reces)(max)
th(dom)(max)
th(reces)(min)
th(dom)(min)
UJA1065
thresholds of
receiving node 1
thresholds of
receiving node 2
© NXP B.V. 2010. All rights reserved.
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