DS3102GN Maxim Integrated Products, DS3102GN Datasheet - Page 128

• Manufacturer Part Number: DS3102GN
• Description: Timers & Support Products Stratum 3 Timing Car d IC SEC-EEC Timing
• Manufacturer: Maxim Integrated Products

____________________________________________________________________________________________ DS3102
9.4
JTAG Test Registers
IEEE 1149.1 requires a minimum of two test registers—the bypass register and the boundary scan register. An
optional test register, the identification register, has been included in the device design. It is used with the IDCODE
instruction and the Test-Logic-Reset state of the TAP controller.
Bypass Register. This is a single 1-bit shift register used with the BYPASS, CLAMP, and HIGHZ instructions to
provide a short path between JTDI and JTDO.
Boundary Scan Register. This register contains a shift register path and a latched parallel output for control cells
and digital I/O cells. BSDL files are available at www.maxim-ic.com/TechSupport/telecom/bsdl.htm.
Identification Register. This register contains a 32-bit shift register and a 32-bit latched parallel output. It is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state. The device
identification code for the DS3102 is shown in Table 9-2.
Table 9-2. JTAG ID Code
DEVICE
REVISION
DEVICE CODE
MANUFACTURER CODE
REQUIRED
DS3102
Consult factory
0000000010100000
00010100001
1
19-4617; Rev 5; 8/10
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