AT32UC3B1256-AUR Atmel, AT32UC3B1256-AUR Datasheet - Page 605

• Manufacturer Part Number: AT32UC3B1256-AUR
• Description: MCU AVR32 256K FLASH 48-TQFP
• Manufacturer: Atmel
• Series: AVR®32 UC3r

Specifications of AT32UC3B1256-AUR

• Package / Case: 48-TQFP, 48-VQFP
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Operating Temperature: -40°C ~ 85°C
• Speed: 60MHz
• Number Of I /o: 28
• Core Processor: AVR
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Program Memory Size: 256KB (256K x 8)
• Data Converters: A/D 6x10b
• Oscillator Type: Internal
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Connectivity: I²C, IrDA, SPI, SSC, UART/USART, USB
• Core Size: 32-Bit
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

27.5.2.3
32059J–12/2010
EXTEST
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan chain.
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
Table 27-11. SAMPLE_PRELOAD Details
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the 32-bit AVR package. The contents of the latched outputs of the boundary-scan chain is
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
Table 27-12. EXTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Details
00010 (0x02)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Details
00011 (0x03)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
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