LH28F008SAT-85 Sharp Microelectronics, LH28F008SAT-85 Datasheet - Page 23

• Manufacturer Part Number: LH28F008SAT-85
• Description: IC FLASH 8MBIT 85NS 40TSOP
• Manufacturer: Sharp Microelectronics

Specifications of LH28F008SAT-85

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 8M (1M x 8)
• Speed: 85ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 40-TSOP
• Lead Free Status / RoHS Status: Contains lead / Request inventory verification
• Other names: 425-1836; LHF08S49

sharp
AC INPUT/OUTPUT REFERENCE WAVEFORM (1)
HIGH SPEED
AC INPUT/OUTPUT REFERENCE WAVEFORM (2)
NOTES:
1. Testing characteristics for LH28F008SA-85 in Standard configuration.
2. Testing characteristics for LH28F008SA-85 in High Speed configuration.
14. AC CHARACTERISTICS — Read-Only Operations
NOTES:
1. See AC Input/Output Reference Waveform for timing measurements.
2. OE# may be delayed up to t
3. Sampled, not 100% tested.
4. See High Speed AC Input/Output Reference Waveforms and High Speed AC Testing Load circuits for testing characteristics.
5. See AC Input/Output Reference Waveforms and AC Testing Load Circuits for testing characteristics.
AC test inputs are driven at V
(0.45V
(0.8V
to 90%) <10ns.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0".
Input timing begins, and output timing ends, at 1.5V. Input rise and fall
times (10% to 90%) <10ns.
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
Symbol
TTL
TTL
). Output timing ends at V
t
t
t
t
t
t
t
t
t
t
) for a Logic "0". Input timing begins at V
RC
ACC
CE
PWH
OE
LZ
HZ
OLZ
DF
OH
3.0
0.0
0.45
2.4
INPUT
INPUT
Read Cycle Time
Address to Output Delay
CE# to Output Delay
RP# High to Output Delay
OE# to Output Delay
CE# to Output Low Z
CE# High to Output High Z
OE# to Output Low Z
OE# High to Output High Z
Output Hold from
Addresses, CE# or OE#
Change,Whichever is First
1.5
Versions
2.0
0.8
Parameter
CE
TEST POINTS
TEST POINTS
OH
-t
IH
OE
and V
(2.4V
after the falling edge of CE# without impact on t
IL
TTL
. Input rise and fall times (10%
) for a Logic "1" and V
1.5
2.0
0.8
Notes
IH
2
2
3
3
3
3
3
(2.0V
OUTPUT
OUTPUT
LHF08S49
TT
L ) and V
V
Min.
CC
85
0
0
0
=5V±0.25V
OL
IL
(1)
Max.
AC TESTING LOAD CIRCUIT (1)
HIGH SPEED
AC TESTING LOAD CIRCUIT (2)
400
85
85
40
55
30
(4)
CE
.
R
C
(C
R
C
(C
V
Min.
L
L
L
L
CC
90
L
=3.3kΩ
=100pF
0
0
0
L
=3.3kΩ
=30pF
Includes Jig Capacitance)
Includes Jig Capacitance)
=5V±0.5V
DEVICE
UNDER
DEVICE
UNDER
TEST
TEST
Max.
400
(5)
90
90
45
55
30
1.3V
1.3V
R
R
1N914
C
L
1N914
C
L
L
L
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
OUT
OUT
20