ADUC7039BCP6Z-RL Analog Devices Inc, ADUC7039BCP6Z-RL Datasheet - Page 11

• Manufacturer Part Number: ADUC7039BCP6Z-RL
• Description: Flash 64k ARM7 Dual 16-Bit ADC LIN I.C.
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7039BCP6Z-RL

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 20.48MHz
• Connectivity: LIN, SPI
• Peripherals: POR, Temp Sensor, WDT
• Number Of I /o: 6
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 3.5 V ~ 18 V
• Data Converters: A/D 2x16b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 115°C
• Package / Case: 32-LFCSP
• Lead Free Status / RoHS Status: Lead free by exemption / RoHS compliant by exemption
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free by exemption / RoHS compliant by exemption

TERMINOLOGY
Conversion Rate
The conversion rate specifies the rate at which an output result
is available from the ADC, after the ADC has settled.
The sigma-delta (Σ-Δ) conversion techniques used on this part
mean that while the ADC front-end signal is oversampled at a
relatively high sample rate, a subsequent digital filter is used to
decimate the output giving a valid 16-bit data conversion result
at output rates from 1 Hz to 1 kHz.
Note that when software switches from one input to another
(on the same ADC), the digital filter must first be cleared and
then allowed to average a new result. Depending on the con-
figuration of the ADC and the type of filter, this can require
multiple conversion cycles.
Integral Nonlinearity (INL)
INL is the maximum deviation of any code from a straight
line passing through the endpoints of the transfer function.
The endpoints of the transfer function are zero scale, a point
½ LSB below the first code transition, and full scale, a point ½
LSB above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
No Missing Codes
No missing codes is a measure of the differential nonlinearity
of the ADC. The error is expressed in bits and specifies the
number of codes (ADC results) as 2
missing codes, guaranteed to occur through the full ADC
input range.
Offset Error
Offset error is the deviation of the first code transition ADC
input voltage from the ideal first code transition.
Offset Error Drift
Offset error drift is the variation in absolute offset error with
respect to temperature. This error is expressed as LSB/°C
or nV/°C.
Gain Error
Gain error is a measure of the span error of the ADC. It is a
measure of the difference between the measured and the ideal
span between any two points in the transfer function.
N
bits, where N = no
Rev. B | Page 11 of 92
Output Noise
The output noise is specified as the standard deviation (or 1 × Σ)
of ADC output codes distribution collected when the ADC
input voltage is at a dc voltage. It is expressed as μV or nV rms.
The output, or rms noise, can be used to calculate the effective
resolution of the ADC as defined by the following equation:
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 × Σ of the distribution of ADC output codes col-
lected when the ADC input voltage is at dc. The peak-to-peak
noise is, therefore, calculated as 6.6 × the rms noise.
The peak-to-peak noise can be used to calculate the ADC
(noise free, code) resolution for which there is no code flicker
within a 6.6 × Σ limit as defined by the following equation:
Table 4. Data Sheet Acronyms
Acronym
ADC
ARM
JTAG
LIN
LSB
MCU
MMR
MSB
OTP
PID
POR
rms
Effective Resolution = log
Noise Free Code Resolution = log
to-Peak Noise) bits
Local interconnect network
Protected identifier
Definition
Analog-to-digital converter
Advanced RISC machine
Joint test action group
Least significant byte/bit
Microcontroller
Memory mapped register
Most significant byte/bit
One time programmable
Power-on reset
Root mean square
2
(Full-Scale Range/rms Noise) bits
2
(Full-Scale Range/Peak-
ADuC7039