AT91SAM9260B-CU-999 Atmel, AT91SAM9260B-CU-999 Datasheet - Page 49

IC MCU ARM9 217LFBGA

AT91SAM9260B-CU-999

Manufacturer Part Number
AT91SAM9260B-CU-999
Description
IC MCU ARM9 217LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet

Specifications of AT91SAM9260B-CU-999

Core Processor
ARM9
Core Size
16/32-Bit
Speed
180MHz
Connectivity
EBI/EMI, Ethernet, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
POR, WDT
Number Of I /o
96
Program Memory Size
32KB (32K x 8)
Program Memory Type
ROM
Ram Size
24K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 4x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
217-LFBGA
Processor Series
AT91SAMx
Core
ARM926EJ-S
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
2-Wire, EBI, I2S, SPI, USART
Maximum Clock Frequency
180 MHz
Number Of Programmable I/os
96
Number Of Timers
6
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM9260-EK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 4 Channel
For Use With
AT91SAM9260-EK - KIT EVAL FOR AT91SAM9260AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT91SAM9260B-CU-999
Manufacturer:
Atmel
Quantity:
10 000
11. AT91SAM9260 Debug and Test
11.1
11.2
6221I–ATARM–17-Jul-09
Description
Embedded Characteristics
The AT91SAM9260 features a number of complementary debug and test capabilities. A com-
mon JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
• ARM926 Real-time In-circuit Emulator
• Debug Unit
• IEEE1149.1 JTAG Boundary-scan on All Digital Pins
– Two real-time Watchpoint Units
– Two Independent Registers: Debug Control Register and Debug Status Register
– Test Access Port Accessible through JTAG Protocol
– Debug Communications Channel
– Two-pin UART
– Debug Communication Channel Interrupt Handling
– Chip ID Register
AT91SAM9260
49

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