AT32UC3L064-AUT Atmel, AT32UC3L064-AUT Datasheet - Page 752
AT32UC3L064-AUT
Manufacturer Part Number
AT32UC3L064-AUT
Description
MCU AVR32 64KB FLASH 48TQFP
Manufacturer
Atmel
Series
AVR®32 UC3r
Datasheets
1.ATAVRONE-PROBECBL.pdf
(16 pages)
2.AT32UC3L-EK.pdf
(858 pages)
3.AT32UC3L016-D3HT.pdf
(110 pages)
Specifications of AT32UC3L064-AUT
Core Processor
AVR
Core Size
32-Bit
Speed
50MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, PWM, WDT
Number Of I /o
36
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
16K x 8
Voltage - Supply (vcc/vdd)
1.62 V ~ 3.6 V
Data Converters
A/D 9x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-TQFP, 48-VQFP
Processor Series
AT32UC3x
Core
AVR32
Data Bus Width
32 bit
Data Ram Size
16 KB
Interface Type
SPI/TWI/USART
Maximum Clock Frequency
50 MHz
Number Of Programmable I/os
36
Number Of Timers
7
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR32, EWAVR32-BL
Development Tools By Supplier
AT32UC3L-EK
Minimum Operating Temperature
- 40 C
On-chip Adc
9-ch x 10-bit
Package
48TQFP
Device Core
AVR32
Family Name
AT32
Maximum Speed
50 MHz
Operating Supply Voltage
1.8|3.3 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT32UC3L064-AUT
Manufacturer:
HONGFA
Quantity:
30 000
Part Number:
AT32UC3L064-AUT
Manufacturer:
MICROCHIP/微芯
Quantity:
20 000
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31.5.2.4
31.5.2.5
32099F–11/2010
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 31-15. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3L016/32/64
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