S71WS256NC0BAWE32 SPANSION [SPANSION], S71WS256NC0BAWE32 Datasheet - Page 161

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S71WS256NC0BAWE32

Manufacturer Part Number
S71WS256NC0BAWE32
Description
Stacked Multi-Chip Product (MCP)
Manufacturer
SPANSION [SPANSION]
Datasheet
46 DC and Operating Characteristics
46.1
47 AC Operating Conditions
47.1
September 15, 2005 S71WS-N_01_A4
Common
Test Conditions (Test Load and Test Input/Output Reference)
Notes:
1.
Input Leakage Current
Output Leakage Current
Average Operating
Current
Output Low Voltage
Output High Voltage
Standby Current (CMOS)
Partial Refresh Current
Full Array Partial Refresh Current (I
Input pulse level: 0.2 to V
Input rising and falling time: 3ns
Input and output reference voltage: 0.5 x V
Output load (See
Item
A d v a n c e
Figure
Dout
I
SBP
Symbol
I
I
V
V
(note 1)
I
Figure 47.1 PAR Mode Execution and Exit
I
CC2
SB1
LO
OH
LI
OL
I n f o r m a t i o n
47.1): CL=50pF
S71WS-Nx0 Based MCPs
CC
SBP
-0.2V
V
CS#=V
WE#=V
Cycle time=t
CS#=V
I
I
CS# ≥ V
Other inputs = V
MRS# ≤ 0.2V, CS# ≥ V
Other inputs = V
) is same as Standby Current (I
OL
OH
IN
Z0= 50
=0.1mA
=V
=-0.1mA
SS
IH
IL
IL
CC
, MRS#=V
to V
, MRS#=V
, V
-0.2V, MRS# ≥ V
IO
RC
CC
=V
+3t
SS
SS
SS
Vtt = 0.5 x V DDQ
CC
50
30pF
PC
IH
IH
to V
to V
to V
, I
Test Conditions
, V
, OE#=V
CC
IO
CC
CC
CC
IN
-0.2V
=0mA, 100% duty,
=V
CC
IL
-0.2V,
IH
or V
SB1
or
).
IH
< 40°C
< 85°C
< 40°C
< 85°C
3/4 Block
1/2 Block
1/4 Block
3/4 Block
1/2 Block
1/4 Block
Min Typ Max Unit
1.4
-1
-1
TBD
TBD
TBD
TBD
200
170
150
140
0.2
40
1
1
mA
µA
µA
µA
µA
µA
µA
159
V
V

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