mc9s12e256 Freescale Semiconductor, Inc, mc9s12e256 Datasheet - Page 563

• Manufacturer Part Number: mc9s12e256
• Description: Hcs12 Microcontrollers 16-bit Microcontroller
• Manufacturer: Freescale Semiconductor, Inc

A.1.6
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Freescale Semiconductor
Human Body
Machine
Latch-up
Num
1
2
3
4
5
Model
C
C
C
C
C
C
ESD Protection and Latch-up Immunity
Series Resistance
Storage Capacitance
Number of Pulse per pin
Series Resistance
Storage Capacitance
Number of Pulse per pin
Minimum input voltage limit
Maximum input voltage limit
Human Body Model (HBM)
Machine Model (MM)
Charge Device Model (CDM)
Latch-up Current at 125 C
Latch-up Current at 27 C
positive
negative
positive
negative
positive
negative
positive
negative
Table A-3. ESD and Latch-Up Protection Characteristics
Table A-2. ESD and Latch-up Test Conditions
MC9S12E256 Data Sheet, Rev. 1.08
Rating
Description
Symbol
V
V
V
I
I
HBM
CDM
LAT
LAT
MM
Symbol
Appendix A Electrical Characteristics
R1
R1
—
—
—
—
—
—
C
C
2000
+100
+200
-100
-200
Min
200
500
Value
1500
–2.5
100
200
7.5
3
3
0
3
3
Max
—
—
—
—
—
—
—
Ohm
Ohm
Unit
Unit
pF
pF
mA
mA
V
V
V
V
V
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