AT89C5132 Atmel Corporation, AT89C5132 Datasheet - Page 154

• Manufacturer Part Number: AT89C5132
• Manufacturer: Atmel Corporation

Specifications of AT89C5132

• Flash (kbytes): 64 Kbytes
• Max. Operating Frequency: 20 MHz
• Cpu: 8051-12C
• Max I/o Pins: 44
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device
• Spi: 1
• Uart: 1
• Adc Channels: 2
• Adc Resolution (bits): 10
• Adc Speed (ksps): 22.7
• Sram (kbytes): 2.25
• Self Program Memory: API
• Operating Voltage (vcc): 2.7 to 3.6
• Timers: 2
• Isp: UART/USB
• Watchdog: Yes

23. Electrical Characteristics
23.1
23.2
23.2.1
Table 103. Digital DC Characteristics
V
154
Storage Temperature ..................................... -65°C to +150°C
Voltage on any other Pin to
I
Power Dissipation ............................................................. 1 W
Ambient Temperature Under Bias.................... -40°C to +85°C
V
DD
OL
Symbol
DD .......................................................................................
V
V
V
V
V
V
per I/O Pin ................................................................. 5 mA
= 2.7 to 3.3V , T
V
I
OH1
OH2
OL1
OL2
IH1
IH2
IL
IL
Absolute Maximum Ratings
DC Characteristics
AT89C5132
Digital Logic
Parameter
Input Low Voltage
Input High Voltage (except RST, X1)
Input High Voltage (RST, X1)
Output Low Voltage
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
Output High Voltage
(P1, P2, P3, P4 and P5)
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
Logical 0 Input Current (P1, P2, P3, P4
and P5)
A
= -40 to +85°C
V
SS
.....................................
2.7V to 3.3V
-0.3 to +4.0V
0.2·V
0.7·V
V
V
DD
DD
Min
-0.5
DD
- 0.7
- 0.7
DD
+ 1.1
(2)
*NOTICE:
Typ
(1)
0.2·V
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
V
DD
Max
0.45
0.45
V
-50
DD
DD
+ 0.5
- 0.1
Units
µA
V
V
V
V
V
V
V
I
I
I
I
Vin = 0.45 V
OL
OL
OH
OH
= 1.6 mA
= 3.2 mA
= -30 µA
= -3.2 mA
Test Conditions
4173E–USB–09/07