S9S08SG16E1CTJ Freescale, S9S08SG16E1CTJ Datasheet - Page 291

• Manufacturer Part Number: S9S08SG16E1CTJ
• Manufacturer: Freescale

Specifications of S9S08SG16E1CTJ

• Cpu Family: HCS08
• Device Core Size: 8b
• Frequency (max): 40MHz
• Interface Type: SCI/SPI
• Total Internal Ram Size: 1KB
• # I/os (max): 16
• Number Of Timers - General Purpose: 1
• Operating Supply Voltage (typ): 3.3/5V
• Operating Supply Voltage (max): 5.5V
• Operating Supply Voltage (min): 2.7V
• On-chip Adc: 12-chx10-bit
• Instruction Set Architecture: CISC
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 20
• Package Type: TSSOP
• Program Memory Type: Flash
• Program Memory Size: 16KB
• Lead Free Status / RoHS Status: Compliant

Appendix A
Electrical Characteristics
A.1
This section contains electrical and timing specifications for the MC9S08SG32 Series of microcontrollers
available at the time of publication. The MC9S08SG32 Series includes both:
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
Freescale Semiconductor
•
•
Standard (STD)— devices that are standard-temperature rated. Table rows marked with a
indicate electrical characteristics that apply to these devices.
AEC Grade 0 — devices that are high-temperature rated. Table rows marked with a
electrical characteristics that apply to AEC Grade 0 devices.
C
D
P
T
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved through the design characterization by measuring a statistically relevant
sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08SG32 Data Sheet, Rev. 8
Table A-2
NOTE
may affect device reliability or cause
♦
indicate
♦
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