MFRC53101T/0FE,112 NXP Semiconductors, MFRC53101T/0FE,112 Datasheet - Page 103

IC MIFARE HS READER 32-SOIC

MFRC53101T/0FE,112

Manufacturer Part Number
MFRC53101T/0FE,112
Description
IC MIFARE HS READER 32-SOIC
Manufacturer
NXP Semiconductors
Series
MIFARE®r
Datasheets

Specifications of MFRC53101T/0FE,112

Rf Type
Read Only
Frequency
13.56MHz
Features
ISO14443-A, ISO14443-B, ISO15693
Package / Case
32-SOIC (0.300", 7.50mm Width)
Product
RFID Readers
Operating Temperature Range
- 25 C to + 85 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-2224-5
935269691112
MFRC531
MFRC53101TD

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MFRC53101T/0FE,112
Manufacturer:
NXP/恩智浦
Quantity:
20 000
NXP Semiconductors
MFRC531_34
Product data sheet
PUBLIC
15.2.2 Analog test signals
The analog test signals can be routed to pin AUX by selecting them using the
TestAnaSelect register TestAnaOutSel[4:0] bits.
Table 165. Analog test signal selection
Value
0
1
2
3
4
5
6
7
8
9
A
Fig 26. RX control signals
(1) RFOut; 1 V per division.
(2) MFOUTSelect[2:0] = 011; Manchester with subcarrier; 2 V per division.
(3) MFOUTSelect[2:0] = 100; Manchester; 2 V per division.
Signal Name
VMID
Vbandgap
VRxFollI
VRxFollQ
VRxAmpI
VRxAmpQ
VCorrNI
VCorrNQ
VCorrDI
VCorrDQ
VEvalL
(1)
(2)
(3)
Rev. 3.4 — 26 January 2010
Description
voltage at internal node VMID
internal reference voltage generated by the bandgap
output signal from the demodulator using the I-clock
output signal from the demodulator using the Q-clock
I-channel subcarrier signal amplified and filtered
Q-channel subcarrier signal amplified and filtered
output signal of N-channel correlator fed by the I-channel subcarrier
signal
output signal of N-channel correlator fed by the Q-channel subcarrier
signal
output signal of D-channel correlator fed by the I-channel subcarrier
signal
output signal of D-channel correlator fed by the Q-channel subcarrier
signal
evaluation signal from the left half-bit
056634
10 μs per division
ISO/IEC 14443 reader IC
MFRC531
© NXP B.V. 2010. All rights reserved.
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