MT29F4G08ABBDAH4:D Micron Technology Inc, MT29F4G08ABBDAH4:D Datasheet - Page 112

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MT29F4G08ABBDAH4:D

Manufacturer Part Number
MT29F4G08ABBDAH4:D
Description
MICMT29F4G08ABBDAH4:D 4G SLC NAND FLASH
Manufacturer
Micron Technology Inc

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PDF: 09005aef83b25735
m60a_4gb_nand.pdf – Rev. J 9/11 EN
Notes:
Note:
Table 25: Capacitance
Notes 1–3 apply to all parameters and conditions
Table 26: Test Conditions
Description
Input capacitance
Input/output capacitance (I/O)
Parameter
Input pulse levels
Input rise and fall times
Input and output timing levels
Output load
Output load
1. These parameters are verified in device characterization and are not 100% tested.
2. Test conditions: T
3. Capacitance (C
1. Verified in device characterization, not 100% tested.
IN
= C
C
= 25°C; f = 1 MHz; V
IO
4Gb, 8Gb, 16Gb: x8, x16 NAND Flash Memory
= 20pF) for MT29F8G and (C
112
1.8V
3.3V
Micron Technology, Inc. reserves the right to change products or specifications without notice.
IN
1 TTL GATE and CL = 30pF (1.8V)
1 TTL GATE and CL = 50pF (3.3V)
1 TTL GATE and CL = 30pF (1.8V)
1 TTL GATE and CL = 50pF (3.3V)
Symbol
= 0V.
C
C
IO
IN
IN
0.0V to V
= C
Value
V
Electrical Specifications
2.5ns
5.0ns
CC
IO
/2
= 40pF) for MT29F16G.
CC
Max
© 2009 Micron Technology, Inc. All rights reserved.
10
10
Unit
pF
pF
Notes
1
1

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