IDT82P2282 Integrated Device Technology, Inc., IDT82P2282 Datasheet - Page 359

• Manufacturer Part Number: IDT82P2282
• Description: 2 Channel T1/J1/E1 Transceiver
• Manufacturer: Integrated Device Technology, Inc.

IDT82P2282
6.2
6.2.1
ufacturer Identity and a fixed bit. The IDR is 32 bits long and is parti-
tioned as in Table 83. Data from the IDR is shifted out to the TDO LSB
first.
6.2.2
between the TDI input and TDO output, bypassing the BYR to reduce
test access times.
IEEE STD 1149.1 JTAG Test Access Port
Table 83: IDR
The IDR can be set to define the Vision, the Part Number, the Man-
The BYR consists of a single bit. It can provide a serial path
12 ~ 27
28 ~ 31
Bit No.
JTAG DATA REGISTER
1 ~ 11
DEVICE IDENTIFICATION REGISTER (IDR)
BYPASS REGISTER (BYP)
0
Manufacturer Identity (033H)
Part Number (04BAH)
Version Number
Comments
Set to ‘1’
348
6.2.3
Table 84: Boundary Scan (BS) Sequence
DUAL T1/E1/J1 LONG HAUL / SHORT HAUL TRANSCEIVER
The bidirectional ports interface to 2 boundary scan cells:
- In cell: The Input cell is observable only (BC_4).
- Out cell: The output cell is controllable and observable (BC_1).
The Boundary Scan (BS) sequence is illustrated in Table 84.
BS-Cell Name
DS/RD/SCLK
TSFS2_OUT
WR/RW/SDI
GPIO_OUT
BOUNDARY SCAN REGISTER (BSR)
TSFS2_IN
GPIO_OE
INT_OUT
GPIO_IN
D0_OUT
D1_OUT
D2_OUT
D3_OUT
D4_OUT
D5_OUT
D6_OUT
D7_OUT
INT_OE
D_OEN
TSIG[2]
TSD[2]
SPIEN
D0_IN
D1_IN
D2_IN
D3_IN
D4_IN
D5_IN
D6_IN
D7_IN
MPM
THZ
A[0]
A[1]
A[2]
A[3]
A[4]
A[5]
A[6]
A[7]
A[8]
CS
BS No.
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
October 7, 2003
BS-Cell Type
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
OUT-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL
IN-CELL