SAM9G45 Atmel Corporation, SAM9G45 Datasheet - Page 577

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SAM9G45

Manufacturer Part Number
SAM9G45
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9G45

Flash (kbytes)
0 Kbytes
Pin Count
324
Max. Operating Frequency
400 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
160
Ext Interrupts
160
Usb Transceiver
3
Usb Speed
Hi-Speed
Usb Interface
Host, Device
Spi
2
Twi (i2c)
2
Uart
5
Lin
4
Ssc
2
Ethernet
1
Sd / Emmc
2
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
Yes
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
440
Resistive Touch Screen
Yes
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
64
Self Program Memory
NO
External Bus Interface
2
Dram Memory
DDR2/LPDDR, SDRAM/LPSDR
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
0.9 to 1.1
Fpu
No
Mpu / Mmu
No/Yes
Timers
6
Output Compare Channels
6
Input Capture Channels
6
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
Note:
11053B–ATARM–22-Sep-11
11053B–ATARM–22-Sep-11
For the Test mode, Test_SE0_NAK (see Universal Serial Bus Specification, Revision 2.0: 7.1.20, Test Mode Support). Force the
device in High Speed mode, and configure a bulk-type endpoint. Do not fill this endpoint for sending NAK to the host.
Upon command, a port’s transceiver must enter the High Speed receive mode and remain in that mode until the exit action is
taken. This enables the testing of output impedance, low level output voltage and loading characteristics. In addition, while in
this mode, upstream facing ports (and only upstream facing ports) must respond to any IN token packet with a NAK handshake
(only if the packet CRC is determined to be correct) within the normal allowed device response time. This enables testing of the
device squelch level circuitry and, additionally, provides a general purpose stimulus/response test for basic functional testing.
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577
577

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