MC9S08AW32CFGE Freescale, MC9S08AW32CFGE Datasheet - Page 307

• Manufacturer Part Number: MC9S08AW32CFGE
• Manufacturer: Freescale

Specifications of MC9S08AW32CFGE

• Cpu Family: HCS08
• Device Core Size: 8b
• Frequency (max): 40MHz
• Interface Type: I2C/SCI/SPI
• Total Internal Ram Size: 2KB
• # I/os (max): 34
• Number Of Timers - General Purpose: 8
• Operating Supply Voltage (typ): 3.3/5V
• Operating Supply Voltage (max): 5.5V
• Operating Supply Voltage (min): 2.7V
• On-chip Adc: 8-chx10-bit
• Instruction Set Architecture: CISC
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 44
• Package Type: LQFP
• Program Memory Type: Flash
• Program Memory Size: 32KB
• Lead Free Status / RoHS Status: Compliant

1
A.13 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.13.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
A.13.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
Freescale Semiconductor
Radiated emissions,
electric field
Data based on qualification test results.
Parameter
Radiated Emissions
Conducted Transient Susceptibility
V
Symbol
RE_TEM
Table A-17. Radiated Emissions
MC9S08AW60 Data Sheet, Rev 2
package type
Conditions
V
T
A
DD
64 QFP
= +25
= 5.5V
o
C
32 kHz crystal
4 MHz crystal
Appendix A Electrical Characteristics and Timing Specifications
20 MHz Bus
8 MHz Bus
f
OSC
/f
BUS
500 – 1000 MHz
500 – 1000 MHz
150 – 500 MHz
150 – 500 MHz
0.15 – 50 MHz
0.15 – 50 MHz
50 – 150 MHz
50 – 150 MHz
Frequency
SAE Level
SAE Level
IEC Level
IEC Level
Level
(Max)
-10
-10
16
-1
-6
N
3
1
0
L
2
1
1
dBμV
dBμV
Unit
—
—
—
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