LH28F640BFHE-PBTL70A Sharp Microelectronics, LH28F640BFHE-PBTL70A Datasheet - Page 21

• Manufacturer Part Number: LH28F640BFHE-PBTL70A
• Description: Flash Mem Parallel 3V/3.3V 64M-Bit 4M x 16 70ns 48-Pin TSOP
• Manufacturer: Sharp Microelectronics

Specifications of LH28F640BFHE-PBTL70A

• Package: 48TSOP
• Cell Type: NOR
• Density: 64 Mb
• Architecture: Sectored
• Block Organization: Asymmetrical
• Location Of Boot Block: Bottom
• Typical Operating Supply Voltage: 3|3.3 V
• Sector Size: 8KByte x 8|64KByte x 127
• Timing Type: Asynchronous
• Operating Temperature: -40 to 85 °C
• Interface Type: Parallel

1.2.1 Capacitance
NOTE:
1. Sampled, not 100% tested.
1.2.2 AC Input/Output Test Conditions
Input Capacitance
Output Capacitance
Figure 6. Transient Equivalent Testing Load Circuit
Parameter
V
UN ER
CCQ
0.0
CL Includes Jig
TEST
EVICE
AC test inputs are driven at V
Input timing begins, and output timing ends at V
Worst case speed conditions are when V
Capacitances.
(1)
Figure 5. Transient Input/Output Reference Waveform for V
(T
INPUT
A
V
=+25°C, f=1MHz)
CCQ
Symbol
(min)/2
C
C
OUT
IN
R L =3.3k
C L
N9 4
V
CCQ
CCQ
OUT
/2
(min) for a Logic "1" and 0.0V for a Logic "0".
CC
V
Condition
V
OUT
=V
LHF64FG8
IN
=0.0V
CC
=0.0V
TEST POINTS
(min).
CCQ
/2. Input rise and fall times (10% to 90%) < 5ns.
Table 14. Configuration Capacitance Loading Value
Test Configuration
V
CC
Min.
=2.7V-3.6V
CC
=2.7V-3.6V
Typ.
4
6
V
CCQ
/2
OUTPUT
Max.
10
7
C
L
70
(pF)
Rev. 2.45
Unit
pF
pF
18