AT32UC3A1512-AUR Atmel, AT32UC3A1512-AUR Datasheet - Page 741

no-image

AT32UC3A1512-AUR

Manufacturer Part Number
AT32UC3A1512-AUR
Description
MCU 32BIT 512KB FLASH 100-TQFP
Manufacturer
Atmel
Series
AVR®32 UC3r
Datasheets

Specifications of AT32UC3A1512-AUR

Core Processor
AVR
Core Size
32-Bit
Speed
66MHz
Connectivity
Ethernet, I²C, SPI, SSC, UART/USART, USB OTG
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
69
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-TQFP, 100-VQFP
For Use With
ATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMR770-1008 - ISP 4PORT ATMEL AVR32 MCU SPIATSTK600-TQFP100 - STK600 SOCKET/ADAPTER 100-TQFPATEVK1100 - KIT DEV/EVAL FOR AVR32 AT32UC3A
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT32UC3A1512-AUR
Manufacturer:
Atmel
Quantity:
10 000
36. JTAG and Boundary Scan
36.1
36.2
32058J–AVR32–04/11
Features
Overview
Rev.: 2.0.0.2
Figure 36-1 on page 742
troller is a state machine controlled by the TCK and TMS signals. The TAP Controller selects
either the JTAG Instruction Register or one of several Data Registers as the scan chain (shift
register) between the TDI-input and TDO-output. The Instruction Register holds JTAG instruc-
tions controlling the behavior of a Data Register.
The ID Register, Bypass Register, and the Boundary-Scan Chain are the Data Registers used
for board-level testing. The Reset Register can be used to keep the device reset during test or
programming.
The Service Access Bus (SAB) interface contains address and data registers for the Service
Access Bus, which gives access to on-chip debug, programming, and other functions in the
device. The SAB offers several modes of access to the address and data registers, as dis-
cussed in
Section 36.7
document.
IEEE1149.1 compliant JTAG Interface
Boundary-Scan Chain for board-level testing
Direct memory access and programming capabilities through JTAG interface
On-Chip Debug access in compliance with IEEE-ISTO 5001-2003 (Nexus 2.0)
Section
lists the supported JTAG instructions, with references to the description in this
36.6.4.
shows how the JTAG is connected in an AVR32 device. The TAP Con-
AT32UC3A
741

Related parts for AT32UC3A1512-AUR